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1998, vol.56, no.1	1998, vol.56, no.10	1998, vol.56, no.11	1998, vol.56, no.12	1998, vol.56, no.2	1998, vol.56, no.3
1998, vol.56, no.4	1998, vol.56, no.5	1998, vol.56, no.6	1998, vol.56, no.7	1998, vol.56, no.8	1998, vol.56, no.9

题名	作者	出版年	年卷期
Effect of front surface roughness on ultrasonic contact testing: A few practical observations	M. Thavasimuthu; C. Rajagopalan; T. Jayakumar; Baldev Raj	1998	1998, vol.56, no.11
Elcetromagnetic wire rope inspection-resolution is important	Herbert R. Weischedel	1998	1998, vol.56, no.11
Understanding remote field logs(part)	T. R. Schmidt; D. L. Atherton	1998	1998, vol.56, no.11
Wrestling with amoebas: Recounting a first encounter with ANSI and the European Committee on Standardization(CEN)	Thomas R. Goldberg	1998	1998, vol.56, no.11