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1999, vol.66, no.1	1999, vol.66, no.10	1999, vol.66, no.11	1999, vol.66, no.12	1999, vol.66, no.2	1999, vol.66, no.3
1999, vol.66, no.4	1999, vol.66, no.5	1999, vol.66, no.6	1999, vol.66, no.7-8	1999, vol.66, no.9

题名	作者	出版年	年卷期
Analysis and modeling of technical surfaces with combinative laser metrology	Wolfgang Osten	1999	1999, vol.66, no.11
Analysis of surface processes by means of speckle-correlation	Thomas Fricke-Begemann; Gerd Gulker; Klaus D. Hinsch; Karin Wolff	1999	1999, vol.66, no.11
High resolution topometry in conjunction with macro structures	A. Duparre; G. Notni; R. -J. Recknagel; T. Feigl; S. Gliech	1999	1999, vol.66, no.11
Highly-resolved measurement of extended technical surfaces with scalable topometry	Wolfgang Osten; Peter Andra; Daniel Kayser	1999	1999, vol.66, no.11
High-Precision optical profilometry at surfaces with varying materials	Holger Jennewein; Thomas Ganz; Harald Gottschling; Theo Tschudi	1999	1999, vol.66, no.11
Measurement and description of microstructures with consideration of material-specific characteristics	H. J. Tiziani; R. Windecker; M. Wegner; K. Leonhardt; D. Steudle; M. Fleischer	1999	1999, vol.66, no.11
Precise structure measurement using laser-based microellipsometry	W. Holzapfel; U. Neuschaefer-Rube; J. Doberitzsch; F. Wirth	1999	1999, vol.66, no.11