期刊


ISSN8756-6990
刊名Optoelectronics, Instrumentation and Data Processing
参考译名光电子学、仪表与数据处理
收藏年代2000～2023



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2000, no.1 2000, no.2 2000, no.3 2000, no.4 2000, no.5 2000, no.6

题名作者出版年年卷期
Thermodiffusional formation of refractive index profiles in glass waveguidesA. V. Kazakevich; D. G. Sannikov20002000, no.6
Detection and estimation of the random process change-point by brief observation samplesW. A. Grushin20002000, no.6
Estimation of resolution of digital X-ray systemsV. A. Udod; A. K. Temnik; V. I. Solodushkin20002000, no.6
Magnetocardiographic study technologyS. V. Motorin20002000, no.6
Application of integrated photodetectors to remote diagnostics of high-temperature processesO. I. Potaturkin; P. A. Chubakov; A. V. Yakovlev20002000, no.6
Improvement of oxygen concentration measurement accuracy in digital solid-electrolytic gas analyzersM. A. Gofman; M. V. Kolechkin; O. I. Potaturkin; P. A. Chubakov20002000, no.6
Filtering features of the measuring base in profilometry problemsV. V. Dyomin; V. G. Maksimov; I. G. Polovtsev20002000, no.6
Thermoinduced processes in bismuth orthogermanate crystalsV. A. Gusev; V. D. Antsygin; I. N. Kupriyanov; Ya. V. Vasiliev; V. N. Shlegel; N. V. Ivannikova20002000, no.6
Metrological characteristics of panoramic holographic interferometersE. A. Krasnopevtsev20002000, no.6
Measurement of nonequilibrium carrier recombination lifetime in silicon wafers by noncontact microwave techniqueP. A. Borodovskii; A. F. Buldygin; A. S. Tokarev20002000, no.6
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