期刊


ISSN0171-8096
刊名Technisches Messen
参考译名技术检测
收藏年代1998～2024



全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2024

2000, vol.2, no.12 2000, vol.67, no.1 2000, vol.67, no.10 2000, vol.67, no.11 2000, vol.67, no.12 2000, vol.67, no.2
2000, vol.67, no.3 2000, vol.67, no.4 2000, vol.67, no.5 2000, vol.67, no.6 2000, vol.67, no.7-8 2000, vol.67, no.9

题名作者出版年年卷期
About several calibrated scanning force microscopes in the PTBKlaus Hasche; Konrad Herrmann; Werner Mirande; Reiner Seemann; Thomas Ahbe; Hans Buchner20002000, vol.67, no.7-8
Detection of micronewton forces in tribologyM. Scherge; S. I. Ahmed; O. Mollenhauer; F. Spiller20002000, vol.67, no.7-8
Future requirements on micro- and nanomeasurement technique - challenges and approachesA. Weckenmann; R. Ernst20002000, vol.67, no.7-8
Interferometric calibration procedures of the step-width control of a phase-stepping interferometerArnold Nicolaus; Gerhard Bonsch; Chu-Shik Kang20002000, vol.67, no.7-8
Nano measuring machine for zero Abbe offset coordinate-measuringGerd Jager; Eberhard Manske; Tino Hausotte; Hans-Joachim Buchner20002000, vol.67, no.7-8
Nano positioning devices - the basis of nano-metrologyGunter Wilkening20002000, vol.67, no.7-8
Nano-positioning with integrated multi-coordinate drivesEberhard Kallenbach; Eugen Saffert20002000, vol.67, no.7-8
Wavelets: an introduction for potential users, part 5Roland Best20002000, vol.67, no.7-8



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