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2000, vol.33, no.1	2000, vol.33, no.10	2000, vol.33, no.11	2000, vol.33, no.12	2000, vol.33, no.2	2000, vol.33, no.3
2000, vol.33, no.4	2000, vol.33, no.5	2000, vol.33, no.6	2000, vol.33, no.7	2000, vol.33, no.8	2000, vol.33, no.9

题名	作者	出版年	年卷期
Development of a test to evaluate the formability of CHQ wire	Robin Thibau; Alain Trudel; D. Baragar; Paul R. Hastings	2000	2000, vol.33, no.2
High performance cleaning of nonferrous wire	Norman Chow; Cliff Mui; Jim Alexander	2000	2000, vol.33, no.2
Physically foamed insulation for datacom categories 6 and 7	Kurt Kerschbaum	2000	2000, vol.33, no.2
Torsion test: in-depth characterization and microscopic analysis	Yea-Yang Su; Robert M. Shemenski	2000	2000, vol.33, no.2