制造业外文文献服务平台 | foreigndata.cmes.org

期刊

全部

2000, vol.100, no.140	2000, vol.100, no.313	2000, vol.100, no.377	2000, vol.100, no.445	2000, vol.100, no.524	2000, vol.100, no.623
2000, vol.100, no.66	2000, vol.100, no.706

题名	作者	出版年	年卷期
Characteristics and long-term reliability of silica-based thermo-optic switch modules	T. Goh; M. Okuno; Y. Hibino	2000	2000, vol.100, no.706
Study of chip durability structure of contactless IC cards	Nobuhiro Shimoyama; Hideyuki Unno; Tadao Takeda	2000	2000, vol.100, no.706
Sample preparation technique for failure analysis	Shinji Nakamura; Shigeru Nakajima	2000	2000, vol.100, no.706
Safety integrity levels model for safety-related systems with automatic diagnoses	Takuya Kawahara; Akihiro Ichitsuka; Yoshinobu Sato; Wei Long	2000	2000, vol.100, no.706