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题名	作者	出版年	年卷期
Fundamental limits of silicon technology	Robert W. Keyes	2001	2001, vol.89, no.3
Material and process limits in silicon VLSI technology	James D. Plummer; Peter B. Griffin	2001	2001, vol.89, no.3
Device scaling limits of Si MOSFETs and their application dependencies	David J. Frank; Robert H. Dennard; Edward Nowak; Paul M. Solomon; Yuan Taur; Hon-Sum Philip Wong	2001	2001, vol.89, no.3
Analog at milepost 2000: a personal perspective	Barrie Gilbert	2001	2001, vol.89, no.3
Interconnect limits on gigascale integration (GSI) in the 21st century	Jeffrey A. Davis; Raguraman Venkatesan; Alain Kaloyeros; Michael Beylansky; Shukri J. Souri; Kaustav Banerjee; Krishna C. Saraswat; Arifur Rahman; Rafael Reif; James D. Meindl	2001	2001, vol.89, no.3
Coming challenges in microarchitecture and architecture	Ronny Ronen; Avi Mendelson; Konrad Lai; Shih-Lien Lu; Fred Pollack; John P. Shen	2001	2001, vol.89, no.3
Limitations and challenges of computer-aided design technology for CMOS VLSI	Randal E. Bryant; Kwang-Ting Cheng; Andrew B. Kahng; Kurt Keutzer; Wojciech Maly; Richard Newton; Lawrence Pileggi; Jan M. Rabaey; Alberto Sangiovanni-Vincentelli	2001	2001, vol.89, no.3
Limits of lithography	Lloyd R. Harriott	2001	2001, vol.89, no.3
Limits of integrated-circuit manufacturing	Robert Doering; Yoshio Nishi	2001	2001, vol.89, no.3
New paradigm of silicon technology	Tadahiro Ohmi; Shigetoshi Sugawa; Koji Kotani; Masaki Hirayama; Akihiro Morimoto	2001	2001, vol.89, no.3