期刊


ISSN0968-4328
刊名Micron
参考译名微米
收藏年代2002～2025



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2002 2003 2004 2005 2006 2007
2008 2009 2010 2011 2012 2013
2014 2015 2016 2017 2018 2019
2020 2021 2022 2023 2024 2025

2002, vol.33, no.1 2002, vol.33, no.2 2002, vol.33, no.3 2002, vol.33, no.4 2002, vol.33, no.5 2002, vol.33, no.6
2002, vol.33, no.7-8

题名作者出版年年卷期
A new symmetrized solution for phase retrieval using the transport to intensity equationV. V. Volkov; Y. Zhu; M. De Graef20022002, vol.33, no.5
The female gonad of the epizoic platyhelminth Troglocaridicola sp. (Rhabdocoela, Temnocephalida, Scutariellidae): ultrastructural and cytochemical investigationsAlessandra Falleni; Paolo Lucchesi; Vittorio Gremigni20022002, vol.33, no.5
Antennal sensilla of the ground beetle Bembidion properans Steph (Coleoptera, Carabidae)Enno Merivee; Angela Ploomi; Mart Rahi; Jose Bresciani; Hans Peter Ravn; Anne Luik; Vaino Sammelselg20022002, vol.33, no.5
Behavior of metal nanoparticles in the electron beamMiyoko Tanaka; Masaki Takeguchi; Kazuo Furuya20022002, vol.33, no.5
Morphometry of E-PTA stained synapses at the periphery of pathological lesionsCarlo Bertoni-Freddari; Patrizia Fattoretti; Riccardo Ricciuti; Stefano Vecchioni; Tiziana Casoli; Moreno Solazzi; Alessandro Ducati20022002, vol.33, no.5
FMRFamide-like midgut endocrine cells during the metamorphosis in Melipona quadrifasciata anthidioides (hymenoptera, apidae)C. A. Neves; L. L. Bhering; J. E. Serrao; L. B. Gitirana20022002, vol.33, no.5
Routine preparation of air-dried negatively stained and unstained specimens on holey carbon support films: a review of applicationsJ. Robin Harris; Dirk Scheffler20022002, vol.33, no.5
pH-dependent effect of heat-induced antigen retrieval of epoxy section for electron microscopyS. H. Brorson20022002, vol.33, no.5
Electron tomography and computer visualization of a three-dimensional 'photonic' crystal in a butterfly wing-scaleA. Argyros; S. Manos; M. C. J. Large; D. R. McKenzie; G. C. Cox; D. M. Dwarte20022002, vol.33, no.5
Preparation of metallized GaN/sapphire cross sections for TEM analysis using wedge polishingJ. Chen; D. G. Ivey20022002, vol.33, no.5
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