知识中心主页
文献服务
文献资源
外文期刊
外文会议
专业机构
智能制造
高级检索
版权声明
使用帮助
期刊
ISSN
0925-1030
刊名
Analog Integrated Circuits and Signal Processing
参考译名
模拟集成电路与信号处理
收藏年代
2000~2024
全部
2000
2001
2002
2003
2004
2005
2006
2007
2008
2009
2010
2011
2012
2013
2014
2015
2016
2017
2018
2019
2020
2021
2022
2023
2024
2003, vol.34, no.1
2003, vol.34, no.2
2003, vol.34, no.3
2003, vol.35, no.1
2003, vol.35, no.2-3
2003, vol.36, no.1-2
2003, vol.36, no.3
2003, vol.37, no.1
2003, vol.37, no.2
2003, vol.37, no.3
题名
作者
出版年
年卷期
An interconnect scaling scheme with constant on-chip inductive effects
Kaustav Banerjee; Amit Mehrotra
2003
2003, vol.35, no.2-3
An accurate transient analysis of high-speed package interconnects using convolution technique
Wendemagegnehu T. Beyene; Chuck Yuan
2003
2003, vol.35, no.2-3
Integrated inductors modeling for library development and layout generation
Jose R. Sendra; Javier Del Pino; Antonio Hernandez; Benito Gonzalez; Javier Garcia; Andres Garcia-Alonso; Antonio Nunez
2003
2003, vol.35, no.2-3
Cross-coupled noise propagation in VLSI designs
Vladimir Zolotov; David Blaauw; Rajendran Panda; Chanhee Oh
2003
2003, vol.35, no.2-3
Closed-form crosstalk noise delay metrics
Lauren Hui Chen; Malgorzata Marek-Sadowska
2003
2003, vol.35, no.2-3
Design of digital window comparators and their implementation within mixed-signal DfT schemes
Daniela De Venuto; Michael J. Ohletz; Bruno Ricco
2003
2003, vol.35, no.2-3
Automated system-level test development for mixed-signal circuits
Sule Ozev; Alex Orailoglu
2003
2003, vol.35, no.2-3
Comparator generation and selection for highly linear CMOS flash analog-to-digital converter
Jincheol Yoo; Kyusun Choi; Daegyu Lee
2003
2003, vol.35, no.2-3
Fault sensitivity and tolerance of successive approximation and △-∑ analog-to-digital converters (ADCs)
Mandeep Singh; Israel Koren
2003
2003, vol.35, no.2-3
Layout-specific circuit evaluation in 3-D integrated circuits
Syed M. Alam; Donald E. Troxel; Carl V. Thompson
2003
2003, vol.35, no.2-3
1
2
制造业外文文献服务平台