期刊


ISSN1063-7397
刊名Russian Microelectronics
参考译名俄罗斯微电子学
收藏年代2002～2023



全部

2002 2003 2004 2005 2006 2007
2008 2009 2010 2011 2012 2013
2014 2015 2016 2017 2018 2019
2020 2021 2022 2023

2003, vol.32, no.1 2003, vol.32, no.2 2003, vol.32, no.3 2003, vol.32, no.4 2003, vol.32, no.5 2003, vol.32, no.6

题名作者出版年年卷期
Deep-Level Effects in GaAs Microelectronics: A ReviewN. P. Khuchua; L. V. Khvedelidze; M. G. Tigishvili; N. B. Gorev; E. N. Privalov; I. F. Kodzhespirova20032003, vol.32, no.5
Phase Formation in a Ta-Ni-N Thin Film during Its Electron-Beam Evaporation Deposition on a Heated Si(100) SubstrateA. G. Vasiliev; A. L. Vasiliev; R. A. Zakharov; A. A. Orlikovsky; I. A. Horin; M. Eindou20032003, vol.32, no.5
Novel Ion-Lens Configurations: A Further Step to 2-nm Ion-Beam LithographyV. A. Zhukov; M. M. Nesterov20032003, vol.32, no.5
Stationary High-Field Domain in Si: Zn at the Excitation Threshold of Recombination WavesA. V. Gostev; B. V. Kornilov; V. V. Privezentsev; E. I. Rau20032003, vol.32, no.5
Comparative Study of an RF and a Microwave High-Density-Plasma Source for Plasma Immersion Ion ImplantationS. N. Averkin; A. P. Ershov; A. A. Orlikovsky; K. V. Rudenko; Ya. N. Sukhanov20032003, vol.32, no.5
Chaotic Solid-State Oscillators of High Spectral Stability with a Wideband Negative-Differential-Resistance SubsystemV. G. Prokopenko20032003, vol.32, no.5
Transient Analysis of Shielded On-Chip InterconnectionsV. A. Goryachev; S. M. Zakharov20032003, vol.32, no.5
Incoming Control of Solid-State Parts: A ReviewM. I. Gorlov; A. V. Andreev20032003, vol.32, no.5



制造业外文文献服务平台