期刊


ISSN0129-1564
刊名International Journal of High Speed Electronics and Systems
参考译名国际高速电子学与系统杂志
收藏年代2000～2023



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2011 2012
2013 2014 2017 2018 2019 2020
2021 2022 2023

2004, vol.14, no.1 2004, vol.14, no.2 2004, vol.14, no.3 2004, vol.14, no.4

题名作者出版年年卷期
SINGLE EVENT EFFECTS IN AVIONICS AND ON THE GROUNDEUGENE NORMAND20042004, vol.14, no.2
SOFT ERRORS IN COMMERCIAL INTEGRATED CIRCUITSR. C. BAUMANN20042004, vol.14, no.2
SINGLE-EVENT EFFECTS IN III-V SEMICONDUCTOR ELECTRONICSDALE McMORROW; JOSEPH S. MELINGER20042004, vol.14, no.2
INVESTIGATION OF SINGLE-EVENT TRANSIENTS IN FAST INTEGRATED CIRCUITS WITH A PULSED LASERP. Fouillat; V. Pouget; D. Lewis; S. Buchner; D. McMorrow20042004, vol.14, no.2
SYSTEM LEVEL SINGLE EVENT UPSET MITIGATION STRATEGIESW. F. HEIDERGOTT20042004, vol.14, no.2
RADIATION-TOLERANT DESIGN FOR HIGH PERFORMANCE MIXED-SIGNAL CIRCUITSW. T. HOLMAN20042004, vol.14, no.2
A TOTAL-DOSE HARDENING-BY-DESIGN APPROACH FOR HIGH-SPEED MIXED-SIGNAL CMOS INTEGRATED CIRCUITSNATHAN NOWLIN; JOHN BAILEY; BOB TURFLER; DAVE ALEXANDER20042004, vol.14, no.2
RADIATION ISSUES IN THE NEW GENERATION OF HIGH ENERGY PHYSICS EXPERIMENTSF. FACCIO20042004, vol.14, no.2
SPACE RADIATION EFFECTS IN OPTOCOUPLERSROBERT A. REED; PAUL W. MARSHALL; KENNETH A. LABEL20042004, vol.14, no.2
RADIATION EFFECTS IN CHARGE-COUPLED DEVICE (CCD) IMAGERS AND CMOS ACTIVE PIXEL SENSORSG. R. HOPKINSON; A. MOHAMMADZADEH20042004, vol.14, no.2
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