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2004, vol.52, no.5-6	2004, vol.52, no.7-8	2004, vol.53, no.1-5	2004, vol.53, no.6-8	2004, vol.54, no.1-4	2004, vol.54, no.5-8
2004, vol.55, no.1	2004, vol.55, no.2-5	2004, vol.55, no.6-8	2004, vol.56, no.1-2	2004, vol.56, no.3-4

题名	作者	出版年	年卷期
The use of synchrotron radiation techniques in the characterization of strained semiconductor heterostructures and thin films	C. Lamberti	2004	2004, vol.53, no.1-5