期刊


ISSN0957-4522
刊名Journal of Materials Science
参考译名材料科学杂志：电子材料
收藏年代1999～2013



全部

1999 2000 2001 2002 2003 2004
2005 2006 2007 2008 2009 2010
2011 2012 2013

2004, vol.15, no.1 2004, vol.15, no.10 2004, vol.15, no.11 2004, vol.15, no.12 2004, vol.15, no.2 2004, vol.15, no.3
2004, vol.15, no.4 2004, vol.15, no.5 2004, vol.15, no.6 2004, vol.15, no.7 2004, vol.15, no.8 2004, vol.15, no.9

题名作者出版年年卷期
Dissolution kinetics and diffusivity of silver in glassy layers for hybrid microelectronicsM. PRUDENZIATI; B. MORTEN; A. F. GUALTIERI; M. LEONI20042004, vol.15, no.7
Tungsten-oxide thin films as novel materials with high sensitivity and selectivity to NO{sub}2,O{sub}3 and H{sub}2S, Part I: Preparation and microstructural characterization of the tungsten-oxide thin filmsO. BERGER; W.-J. FISCHER; V. MELEV20042004, vol.15, no.7
Redistribution of P atoms in oxidized P-implanted silicon during annealingKATSUHIRO YOKOTA; MAKOTO AOKI; KAZUHIRO NAKAMURA; MASAYASU TANNJOU; SHIGEKI SAKAI; KOUHEI SEKINE; MASANORI WATANABE20042004, vol.15, no.7
Properties and structure of semiconducting sodium iron germanoborate glassesM. M. EL-DESOKY; SHERIEF M. ABO-NAF20042004, vol.15, no.7
Preparation and characterization of gold/ poly(vinyl alcohol)/MoS{sub}2 intercalation nanocompositeTINGMEI WANG; WEIMIN LIU; JUN TIAN20042004, vol.15, no.7
Electrochemical studies of n-Cd{sub}(1-x)Mn{sub}xSe thin film photodetectorV. S. KARANDE; S. H. MANE; V. J. PUJARI; L. P. DESHMUKH; A. R. WADGAONKAR20042004, vol.15, no.7
An empirical density of states and joint density of states analysis of hydrogenated amorphous silicon: a reviewSTEPHEN KARRER O'LEARY20042004, vol.15, no.7
Electrical, optical and structural characterization of high-K dielectric ZrO{sub}2 thin films deposited by the pyrosol techniqueG. REYNA-GARCIA; M. GARCIA-HIPOLITO; J. GUZMAN-MENDOZA; M. AGUILAR-FRUTIS; C. FALCONY20042004, vol.15, no.7
Tungsten-oxide thin films as novel materials with high sensitivity and selectivity to NO{sub}2,O{sub}3, and H{sub}2S Part II: Application as gas sensorsO. BERGER; T. HOFFMANN; W.-J. FISCHER; V. MELEV20042004, vol.15, no.7
Structural properties of relaxed Ge buffer layers on Si(001): effect of layer thickness and low temperature Si initial bufferT. MYRBERG; A. P. JACOB; O. NUR; M. FRIESEL; M. WILLANDER; C. J. PATEL; Y. CAMPIDELLI; C. HERNANDEZ; O. KERMARREC; D. BENSAHEL20042004, vol.15, no.7



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