期刊


ISSN8756-6990
刊名Optoelectronics, Instrumentation and Data Processing
参考译名光电子学、仪表与数据处理
收藏年代2000～2023



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2005, vol.41, no.1 2005, vol.41, no.2 2005, vol.41, no.3 2005, vol.41, no.4 2005, vol.41, no.5 2005, vol.41, no.6

题名作者出版年年卷期
DETECTION OF MOVING SPATIALLY EXTENDED OBJECTS AGAINST A BACKGROUND WITH UNKNOWN INTENSITYA. P. Trifonov; R. V. Kutsov20052005, vol.41, no.1
RECOGNITION OF GROUP POINT OBJECTS WITH NON-ORDERED MARKSYa. A. Furman; A. A. Rozhentsov; A. O. Evdokimov20052005, vol.41, no.1
OPTIMIZATION OF THE PARAMETER OF ONE-DIMENSIONAL IMAGE FILTERS BY THE MAXIMUM RESOLUTION CRITERIONV. A. Udod20052005, vol.41, no.1
IDENTIFICATION OF DEPENDENCES ON THE BASIS OF AUTOREGRESSIVE MODELSA. N. Tyrsin20052005, vol.41, no.1
RECONSTRUCTING THE INTERNAL STRUCTURE OF HOMOGENEOUS OBJECTS WITH LOCAL INHOMOGENEITYV. P. Yushchenko20052005, vol.41, no.1
COMPARATIVE ANALYSIS OF NEURAL NETWORK CLUSTERING ALGORITHMS FOR SYMBOL SEQUENCESO. I. Nechaeva20052005, vol.41, no.1
VISUALIZATION AND MEASUREMENT OF OPTICAL INHOMOGENEITIES IN A KGd(WO{sub}4){sub}2 LASER ACTIVE ELEMENT BY ZONE PLATE INTERFEROMETERSS. L. Mikerin; I. G. Palchikova; V. D. Ugozhaev20052005, vol.41, no.1
UNCOOLED RESISTIVE MICROBOLOMETERS, PART I. DC BIASM. A. Dem'yanenko; A. F. Kravchenko; V. N. Ovsyuk20052005, vol.41, no.1
KINETICS OF THE INITIAL GROWTH STAGES OF ZnTe FILMS ON Si(013)D. N. Pridachin; Yu. G. Sidorov; M. V. Yakushev; V. A. Shvets20052005, vol.41, no.1
CERTIFICATION OF DIFFRACTIVE OPTICAL ELEMENTSR. K. Nasyrov; A. G. Poleshchuk; V. P. Korolkov; K. Pruss; S. Reichelt20052005, vol.41, no.1
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