期刊


ISSN0913-5685
刊名電子情報通信学会技術研究報告
参考译名电子信息通信学会技术研究报告：可靠性
收藏年代2000～2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2005, vol.104, no.627 2005, vol.104, no.713 2005, vol.104, no.753 2005, vol.104, no.754 2005, vol.105, no.1 2005, vol.105, no.109
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题名作者出版年年卷期
Contact Arrangement Optimization in Circular Connectors for Differential Signal TransmissionAchim Brenner20052005, vol.105, no.412
Friction and Contact Resistance through True Contact InterfaceTerutaka Tamai20052005, vol.105, no.412
The Resistance Characteristics on the Contaminated Gold Contacts in Handed TerminalsYi-Lin ZHOU; Qiu-Jie XU; Liang-Jun XU20052005, vol.105, no.412
Qualitative discussion for the construction of oxidation layer on copper surface in the process of thermally oxidizingIsao Minowa20052005, vol.105, no.412
A Study on Contact Temperature of Silver Palladium Compounds Related to Opening ConditionKazuaki MIYANAGA; Yoshiki KAYANO; Hiroshi INOUE20052005, vol.105, no.412
Formation Mechanism of Dark Bridge between Contacts with Very Slow Opening SpeedHiroyuki Ishida; Shosuke Suzuki; Hideaki Sone; Hiroshi Inou; Masanari Taniguchi; Tasuku Takagi20052005, vol.105, no.412
Experimental Investigation on the Arc Motion with Different Configurations of Arc Chamber in AC ContactorDegui CHEN; Ruicheng DAI; Xingwen LI20052005, vol.105, no.412
Investigation On The Thermal Process Of Anode In Vacuum ArcZongqian SHI; Shenli JIA; Lijun WANG; Hong Dong20052005, vol.105, no.412
Erosion of Electrical Contact Surfaces in Breaking Arcs at Low Separating SpeedTakayoshi Endou; Yoshinobu Nakamura; Junya Sekikawa; Takayoshi Kubono20052005, vol.105, no.412
A Trial to Explain Arc Duration at a Break ContactKeiichi Suhara20052005, vol.105, no.412
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