期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2025



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024 2025

2005, vol.7, no.1 2005, vol.7, no.2 2005, vol.7, no.3 2005, vol.7, no.4

题名作者出版年年卷期
Assembly Processes - A Surface Electrostatic Discharge Killer for Devices and a FA ChallengePeter Jacob; Joachim Reiner20052005, vol.7, no.2
Single-Cell Failures Caused by a Lateral Gate EffectMartin Versen; Achim Schramm; Peter Beer; Juergen Lindolf20052005, vol.7, no.2
The Nature of Nanometer Timing FailuresJaume Segura; Chuck Hawkins20052005, vol.7, no.2
Micro-calorimeter EDS for Advanced Semiconductor Material AnalysisBirgit Simmnacher; Rainer Weiland; Jens Hohne; Franz V. Feilitzsch; Christian Hollerith20052005, vol.7, no.2



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