期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2025



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024 2025

2005, vol.7, no.1 2005, vol.7, no.2 2005, vol.7, no.3 2005, vol.7, no.4

题名作者出版年年卷期
Electron Tomography and Three-Dimensional Aspects of Transmission Electron MicroscopyA. John Mardinly20052005, vol.7, no.3
CMOS IC Diagnostics Using the Light Emission from Off-State Leakage Currents (LEOSLC)Peilin Song; Stas Polonsky; Franco Stellari; Keith Jenkins; Alan J. Weger; Tian Xia; Shinho Cho20052005, vol.7, no.3
On-Die Parametric Analysis of SRAMBenjamin M. Mauck; Vishnumohan Ravichandran; Usman Azeez Mughal20052005, vol.7, no.3



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