期刊


ISSN1063-7397
刊名Russian Microelectronics
参考译名俄罗斯微电子学
收藏年代2002～2023



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2006, vol.35, no.1 2006, vol.35, no.2 2006, vol.35, no.4 2006, vol.35, no.5 2006, vol.35, no.6

题名作者出版年年卷期
Low-Power CMOS Switched-Capacitor Lowpass Filter Using Current ConveyorsA. S. Korotkov; D. V. Morozov; A. A. Tutyshkin20062006, vol.35, no.6
Equivalent Electrical Network of the DNA MoleculeN. V. Grib; J. A. Berashevich; V. E. Borisenko20062006, vol.35, no.6
Size Effect Relating to the Extraordinary and the Ordinary Hall Effect in Ultrathin Fe-Pt FilmsV. N. Matveev; V. I. Levashov; O. V. Kononenko; A. N. Chaika20062006, vol.35, no.6
Ultimate Thermomechanical Read Rate from AFM Data StorageA. B. Petrin20062006, vol.35, no.6
Axially Symmetric Composite Electromagnetic Mirror for Perfect Axial-Aberration CorrectionV. A. Zhukov; A. V. Zav'yalova20062006, vol.35, no.6
Anomalous Kossel Effect in Semiconductor StructuresP. G. Medvedev; A. M. Afanas'ev; M. A. Chuev20062006, vol.35, no.6
Paramagnetic-Center Detection by SQUID Measurement of Static Magnetic SusceptibilityA. I. Golovashkin; A. L. Karuzskif; V. M. Mishachev; A. A. Orlikovsky; V. V. Privezentsev; A. M. Tshovrebov20062006, vol.35, no.6
Microwave Characterization of Undoped Poly crystalline SiliconP. A. Borodovskii; A. F. Buldygin; A. T. Drofa; A. S. Tokarev20062006, vol.35, no.6
Anomalous Photoconductivity Decay Observed in Microwave Measurements of Carrier Lifetime in Silicon IngotsP. A. Borodovskii; A. F. Buldygin; A. S. Tokarev20062006, vol.35, no.6
Transistor-Degradation Prediction by Time-Series AnalysisM. I. Gorlov; A. V. Strogonov; D. Yu. Smirnov20062006, vol.35, no.5
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