期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2025



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2004 2005 2006 2007 2008 2009
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2006, vol.8, no.1 2006, vol.8, no.2 2006, vol.8, no.3 2006, vol.8, no.4

题名作者出版年年卷期
Nanoprobe Failure Analysis of Sub-100 nm CMOS Transistor TechnologiesRandal Mulder; Sam Subramanian; Tony Chrastecky20062006, vol.8, no.4
What "Green" Means: Challenges for Failure AnalysisBecky Holdford; Roger Stierman20062006, vol.8, no.4
On the Effects of Transient Electromagnetic Interference on Integrated CircuitsBernd Deutschmann; Etienne Sicard; Sonia Ben Dhia20062006, vol.8, no.4
Advances in Magnetic Current Imaging for Die-Level Fault IsolationS. I. Woods; A. Orozco; L. A. Knauss20062006, vol.8, no.4



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