期刊


ISSN0268-3768
刊名The International Journal of Advanced Manufacturing Technology
参考译名先进制造技术国际杂志
收藏年代1998～2024



全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2007, vol.31, no.11-12 2007, vol.31, no.7-8 2007, vol.31, no.9-10 2007, vol.32, no.11-12 2007, vol.32, no.1-2 2007, vol.32, no.3-4
2007, vol.32, no.5-6 2007, vol.32, no.7-8 2007, vol.32, no.9-10 2007, vol.33, no.11-12 2007, vol.33, no.1-2 2007, vol.33, no.3-4
2007, vol.33, no.5-6 2007, vol.33, no.7-8 2007, vol.33, no.9-10 2007, vol.34, no.11-12 2007, vol.34, no.1-2 2007, vol.34, no.3-4
2007, vol.34, no.5-6 2007, vol.34, no.7-8 2007, vol.34, no.9-10

题名作者出版年年卷期
Tribological evaluation of TiN and TiAlN coated PM-HSS gear cutter when machining 19MnCr5 steelJ. A. B. O. dos Santos; W. F. Sales; S. C. Santos; A. R. Machado; M. B. da Silva; J. Bonney; E. O. Ezugwu20072007, vol.31, no.7-8
Estimation of the chatter zones of drilled holes by using s-transformationA. Yenilmez; D. Rincon; I. N. Tansel; F. I. Erazo; X. Wang; P. Chen20072007, vol.31, no.7-8
Robust and stable scheduling of a single machine with random machine breakdownsLin Liu; Han-yu Gu; Yu-geng Xi20072007, vol.31, no.7-8
The upper bound of tool edge radius for nanoscale ductile mode cutting of silicon waferS. Arefin; X. P. Li; M. Rahman; K. Liu20072007, vol.31, no.7-8
KBE-based stamping process paths generated for automobile panelsJinqiao Zheng; Yilin Wang; Zhigang Li20072007, vol.31, no.7-8
Flow patterns in gas-assisted injection molding process in a channelCheng-Hsing Hsu; Po-Chuang Chen; Kuang-Yuan Kung; Chuan Lai20072007, vol.31, no.7-8
Fabrication of WC micro-shaft by using electrochemical etchingS. H. Choi; S. H. Ryu; D. K. Choi; C. N. Chu20072007, vol.31, no.7-8
The use of ultrasonic cavitation peening to improve micro-burr-free surfacesC. K. Toh20072007, vol.31, no.7-8
Simultaneous process mean and process tolerance determination with asymmetrical loss functionAngus Jeang; Chien-Ping Chung; Chih-Kuang Hsieh20072007, vol.31, no.7-8
Development of a new cluster index for wafer defectsLee-Ing Tong; Chung-Ho Wang; Da-Lun Chen20072007, vol.31, no.7-8
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