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期刊
ISSN
0913-5685
刊名
電子情報通信学会技術研究報告
参考译名
电子信息通信学会技术研究报告:可靠性
收藏年代
2000~2024
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2007, vol.107, no.1
2007, vol.107, no.10
2007, vol.107, no.100
2007, vol.107, no.101
2007, vol.107, no.108
2007, vol.107, no.117
2007, vol.107, no.120
2007, vol.107, no.124
2007, vol.107, no.137
2007, vol.107, no.138
2007, vol.107, no.140
2007, vol.107, no.141
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2007, vol.107, no.172
2007, vol.107, no.184
2007, vol.107, no.209
2007, vol.107, no.21
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2007, vol.107, no.245
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2007, vol.107, no.93
题名
作者
出版年
年卷期
Influence of Chemical Topology on the Electrical Properties of Carbon Black - A Theoretical Study
Arunabhiram CHUTIA; Zhigang ZHU; Ai SUZUKI; Riadh SAHNOUN; Hideyuki TSUBOI; Michihisa KOYAMA; Nozomu HATAKEYAMA; Akira ENDOU; Hiromitsu TAKABA; Momoji KUBO; Carlos A. DEL CARPIO; Akira MIYAMOTO
2007
2007, vol.107, no.245
Tight-Binding Quantum Chemical Molecular Dynamics Study on Interfacial Electron Transfer in Dye-Sensitized Anatase (001) Surface
Chen LV; Agalya GOVINDASAMY; Kei OGIYA; Ai SUZUKI; Riadh SAHNOUN; Michihisa KOYAMA; Hideyuki TSUBOI; Nozomu HATAKEYAMA; Akira ENDOU; Hiromitsu TAKABA; Momoji KUBO; Carlos A. DEL CAEPIO; Akira MIYAMOTO
2007
2007, vol.107, no.245
High Performance Accumulation Mode FD-SOI MOSFETs on Si(100) and (110) Surfaces
W. Cheng; A. Teramoto; R. Kuroda; C. Tye; S. Watabe; T. Suwa; T. Goto; F. Imaizumi; S. Sugawa; T. Ohmi
2007
2007, vol.107, no.245
Nitrogen Profile Study for SiON Gate Dielectrics of Advanced DRAM
Shigemi Murakawa; Masashi Takeuchi; Minoru Honda; Shu-ichi Ishizuka; Toshio Nakanishi; Yoshihiro Hirota; Takuya Sugawara; Yoshitsugu Tanaka; Yasushi Akasaka; Akinobu Teramoto; Shigetoshi Sugawa; Tadahiro Ohmi
2007
2007, vol.107, no.245
Development of Multi-Scale Electrical Conductivity Simulator with the Joule Heating Module and its Application to Polycrystalline SiO{sub}2
John Paul YACAPIN; Ai SUZUKI; Riadh SAHNOUN; Michichisa KOYAMA; Hideyuki TSUBOI; Nozomu HATAKEYAMA; Akira ENDOU; Hiromitsu TAKABA; Momoji KUBO; Carlos A. DEL CARPIO; Akira MIYAMOTO
2007
2007, vol.107, no.245
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