期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2025



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024 2025

2007, vol.9, no.1 2007, vol.9, no.2 2007, vol.9, no.3 2007, vol.9, no.4

题名作者出版年年卷期
Interconnect Layout Sensitivity and Yield PredictionPayman Zarkesh-Ha; Ken Doniger20072007, vol.9, no.1
High-Resolution Tabletop Extreme-Ultraviolet MicroscopyCarmen S. Menoni20072007, vol.9, no.1
Voltage Contrast and EBIC Failure Isolation TechniquesMichael Strizich20072007, vol.9, no.1
Test and Failure Analysis: Have We Progressed in Bringing Them Together?Jeremy A. Walraven20072007, vol.9, no.1



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