期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2025



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024 2025

2007, vol.9, no.1 2007, vol.9, no.2 2007, vol.9, no.3 2007, vol.9, no.4

题名作者出版年年卷期
Useful Technique for Analysis of Fluid-Filled CapacitorsStan Silvus; Kenneth Cook20072007, vol.9, no.2
Advanced Defect Isolation Utilizing Image Intensity AnalysisJames J. Demarest; Derren Dunn; Chad Rue; Yun-Yu Wang20072007, vol.9, no.2
Secondary Electron Potential Contrast in Wide-Bandgap Semiconductors: More Than Just Dopant Profiling with the SEMMarco Buzzo; Mauro Ciappa; Wolfgang Fichtner20072007, vol.9, no.2



制造业外文文献服务平台