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期刊
ISSN
1065-514X
刊名
VLSI Design
参考译名
超大规模集成电路设计
收藏年代
2008~2018
全部
2008
2009
2010
2011
2012
2013
2014
2015
2016
2017
2018
2008, vol.2008, no.ICEC
2008, vol.2008, no.REGU
2008, vol.2008, no.SPIM
题名
作者
出版年
年卷期
A Dependable Microelectronic Peptide Synthesizer Using Electrode Data
H. G. Kerkhoff; X. Zhang; F. Mailly; P. Nouet; H. Liu; A. Richardson
2008
2008, vol.2008, no.SPIM
MEMS Switches and SiGe Logic for Multi-GHz Loopback Testing
D. C. Keezer; D. Minier; P. Ducharme; D. Viens; G. Flynn; J. McKillop
2008
2008, vol.2008, no.SPIM
Using Signal Envelope Detection for Online and Offline RF MEMS Switch Testing
E. Simeu; H. N. Nguyen; P. Cauvet; S. Mir; L. Rufer; R. Khereddine
2008
2008, vol.2008, no.SPIM
A Pull-in Based Test Mechanism for Device Diagnostic and Process Characterization
L. A. Rocha; L. Mol; E. Cretu; R. F. Wolffenbuttel; J. Machado da Silva
2008
2008, vol.2008, no.SPIM
Built-in Test Enabled Diagnosis and Tuning of RF Transmitter Systems
Vishwanath Natarajan; Rajarajan Senguttuvan; Shreyas Sen; Abhjit Chatterjee
2008
2008, vol.2008, no.SPIM
A Tool for Single-Fault Diagnosis in Linear Analog Circuits with Tolerance Using the T-Vector Approach
Jose A. Soares Augusto; Carlos Beltran Almeida
2008
2008, vol.2008, no.SPIM
Choice of a High-Level Fault Model for the Optimization of Validation Test Set Reused for Manufacturing Test
Yves Joannon; Vincent Beroulle; Chantal Robach; Smail Tedjini; Jean-Louis Carbonero
2008
2008, vol.2008, no.SPIM
Simple Evaluation of the Nonlinearity Signature of an ADC Using a Spectral Approach
E. J. Peralias; M. A. Jalon; A. Rueda
2008
2008, vol.2008, no.SPIM
ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator
V. Kerzerho; P. Cauvet; S. Bernard; F.Azais; M. Renovell; M. Comte; O. Chakib
2008
2008, vol.2008, no.SPIM
Particle Swarm Optimization for Constrained Instruction Scheduling
Rehab F. Abdel-Kader
2008
2008, vol.2008, no.REGU
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