期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2025



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024 2025

2008, vol.10, no.1 2008, vol.10, no.2 2008, vol.10, no.3 2008, vol.10, no.4

题名作者出版年年卷期
Advanced Defect Characterization by STEM AnalysisSam Subramanian; Raghaw Rai; Khiem Ly; Tony Chrastecky; Randy Mulder; Keith Harber20082008, vol.10, no.2
Failure Analysis and the Scanning Optical MicroscopeR. Aaron Falk20082008, vol.10, no.2
Automated Backside Silicon Polishing for Die Encapsulated in a PackageBonnie Gannon20082008, vol.10, no.2
Trends and Roadmap for Outsourcing and Services In the FA IndustryMichel Villemain20082008, vol.10, no.2



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