期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2025



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024 2025

2008, vol.10, no.1 2008, vol.10, no.2 2008, vol.10, no.3 2008, vol.10, no.4

题名作者出版年年卷期
Complex Systems Failure Analysis ChallengesPatrick Poirier; Patrice Schwindenhammer; Alban Colder; Bernadette Domenges20082008, vol.10, no.4
Response to Counterfeit Integrated Circuit Components in the Supply Chain: Part IGary F. Shade; Brian Wilson20082008, vol.10, no.4
Failure Analysis of X-Ray Flat Detector for Medical ImagingMurielle Beranger20082008, vol.10, no.4
3-D Through-Silicon Via TechnologyE. Jan Vardaman20082008, vol.10, no.4
Agilent's USB Modular Instruments Provide Flexible, Affordable SolutionsLarry Wagner20082008, vol.10, no.4
Presto Engineering Collaborates with Israeli Test HouseLarry Wagner20082008, vol.10, no.4
FEI Connectivity Solutions Improve and Accelerate TEM ImagingLarry Wagner20082008, vol.10, no.4
Presto Authorized as Distributor for iRoC Soft Error Rate TestingLarry Wagner20082008, vol.10, no.4
Agilent Introduces Low-Cost dc Power Supplies with High-Value FeaturesLarry Wagner20082008, vol.10, no.4
ENA Series from Agilent Extends Network Analysis CapabilitiesLarry Wagner20082008, vol.10, no.4
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