期刊


ISSN1063-7397
刊名Russian Microelectronics
参考译名俄罗斯微电子学
收藏年代2002～2023



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2009, vol.38, no.1 2009, vol.38, no.2 2009, vol.38, no.3 2009, vol.38, no.4 2009, vol.38, no.5 2009, vol.38, no.6

题名作者出版年年卷期
Nano- and Micrometer-Scale Thin-Film-Interconnection Failure Theory and Simulation and Metallization Lifetime Prediction, Part 1K. A. Valiev; R. V. Goldstein; Yu. V. Zhitnikov; T. M. Makhviladze; M. E. Sarychev20092009, vol.38, no.6
Simulation of the Effects of Deep Grooving in Silicon in the Plasmochemical Cyclic ProcessA. S. Shumilov; I. I. Amirov; V. F. Lukichev20092009, vol.38, no.6
A Semianalytical Model of a Thin-Channel Field-Effect TransistorA. N. Khomyakov; V. V. V'yurkov20092009, vol.38, no.6
Nonequivalence of Biparticle and Multiparticle Quantum EntanglementsA. Yu. Chernyavskii20092009, vol.38, no.6
Constructivist Treatment of Bell's Inequality Violations and the No-Hidden-Variable TheoremsY. I. Ozhigov20092009, vol.38, no.6
Positronics and Nanotechnologies: Possibilities of Studying Nanoobjects in Critical Engineering Materials Using Positron Annihilation SpectrometryV. I. Grafutin; E. P. Prokop'ev; S. P. Timoshenkov; S. S. Evstaf'ev; Yu. V. Funtikov20092009, vol.38, no.6
Quantum State Depressions in Thin Metal Films with an Indented SurfaceA. N. Tavkhelidze; A. P. Bibilashvili; L. B. Jangidze; B. B. Olsen; H. Walitzki; A. Feinerman20092009, vol.38, no.6



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