期刊


ISSN0268-3768
刊名The International Journal of Advanced Manufacturing Technology
参考译名先进制造技术国际杂志
收藏年代1998～2024



全部

1998 1999 2000 2001 2002 2003
2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024

2009, vol.40, no.11-12 2009, vol.40, no.1-2 2009, vol.40, no.3-4 2009, vol.40, no.5-6 2009, vol.40, no.7-8 2009, vol.40, no.9-10
2009, vol.41, no.11-12 2009, vol.41, no.1-2 2009, vol.41, no.3-4 2009, vol.41, no.5-6 2009, vol.41, no.7-8 2009, vol.41, no.9-10
2009, vol.42, no.1/2 2009, vol.42, no.11/12 2009, vol.42, no.3/4 2009, vol.42, no.5/6 2009, vol.42, no.7/8 2009, vol.42, no.9/10
2009, vol.43, no.1/2 2009, vol.43, no.11/12 2009, vol.43, no.3/4 2009, vol.43, no.5/6 2009, vol.43, no.7/8 2009, vol.43, no.9/10
2009, vol.44, no.1/2 2009, vol.44, no.11/12 2009, vol.44, no.3/4 2009, vol.44, no.5/6 2009, vol.44, no.7/8 2009, vol.44, no.9/10
2009, vol.45, no.1/2 2009, vol.45, no.11/12 2009, vol.45, no.3/4 2009, vol.45, no.5/6 2009, vol.45, no.7/8 2009, vol.45, no.9/10

题名作者出版年年卷期
Multi-response optimization of electro-chemical honing using utility-based Taguchi approachA. K. Dubey20092009, vol.41, no.7-8
A thick SU-8 mask for microabrasive jet machining on glassAgung Shamsuddin Saragih; Tae Jo Ko20092009, vol.41, no.7-8
Multi-response optimisation of WEDM process using principal component analysisSusanta Kumar Gauri; Shankar Chakraborty20092009, vol.41, no.7-8
Taguchi-based Six Sigma approach to optimize plasma cutting process: an industrial case studyJoseph C. Chen; Ye Li; Ronald A. Cox20092009, vol.41, no.7-8
A new chart based on sample variances for monitoring the covariance matrix of multivariate processesA. F. B. Costa; M. A. G. Machado20092009, vol.41, no.7-8
A machine vision system for the detection of missing fasteners on steel stampingsJ. Killing; B. W. Surgenor; C. K. Mechefske20092009, vol.41, no.7-8
An innovative algorithm for statistic sampling of measured points and simplifying measuring probe orientation for sculpture surfacesHui-Chin Chang; Alan C. Lin20092009, vol.41, no.7-8
A comparison study of three non-parametric control charts to detect shift in location parametersNandini Das20092009, vol.41, no.7-8
Applying the one-column, many pencil local scanning maskless lithography technology to micro-RP systemJia-Chang Wang; Ming-Zhe Hsieh20092009, vol.41, no.7-8
Sensitivity analysis of nanoparticles pushing critical conditions in 2-D controlled nanomanipulation based on AFMM. H. Korayem; M. Zakeri20092009, vol.41, no.7-8
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