知识中心主页
文献服务
文献资源
外文期刊
外文会议
专业机构
智能制造
高级检索
版权声明
使用帮助
期刊
ISSN
0925-1030
刊名
Analog Integrated Circuits and Signal Processing
参考译名
模拟集成电路与信号处理
收藏年代
2000~2024
全部
2000
2001
2002
2003
2004
2005
2006
2007
2008
2009
2010
2011
2012
2013
2014
2015
2016
2017
2018
2019
2020
2021
2022
2023
2024
2010, vol.62, no.1
2010, vol.62, no.2
2010, vol.62, no.3
2010, vol.63, no.1
2010, vol.63, no.2
2010, vol.63, no.3
2010, vol.64, no.1
2010, vol.64, no.2
2010, vol.64, no.3
2010, vol.65, no.1
2010, vol.65, no.2
2010, vol.65, no.3
题名
作者
出版年
年卷期
Design of output buffer with low switching noise and load adaptability
Yingyan Lin; Jing Zhang; Xuecheng Zou; Dongsheng Liu; Shuang-yang Wang
2010
2010, vol.65, no.2
Low-power high-speed rail-to-rail LCD output buffer with dual-path push-pull operation and quiescent current control
Davide Marano; Gaetano Palumbo; Salvatore Pennisi
2010
2010, vol.65, no.2
A low noise compact class AB buffer amplifier with accurate quiescent current control
Jian Lv; Yun Zhou; DongLu Zhang; YaDong Jiang
2010
2010, vol.65, no.2
Voltage-mode quadrature sinusoidal oscillator with current tunable properties
Abhirup Lahiri; Winai Jaikla; Montree Siripruchyanun
2010
2010, vol.65, no.2
A clock-free decoder and continuous BLF generator for EPCglobal Gen2 UHF RFID tags
Longfei Tang; Yiqi Zhuang; Weifeng Liu; Zhao Jin; Xiaoming Li
2010
2010, vol.65, no.2
Electronically tunable multiphase sinusoidal oscillator using translinear current conveyors
Montree Kumngern; Jirasak Chanwutitum; Kobchai Dejhan
2010
2010, vol.65, no.2
Modeling and characterization of a 5.2 GHz VCO for UWB applications in 0.13 μm CMOS process
Mohamed Al-Azab
2010
2010, vol.65, no.2
A 3 nV/{the square root of}(Hz) rail-to-rail operational amplifier in silicon-on-sapphire with constant transconductance
Pujitha Weerakoon; Frederick J. Sigworth; Peter J. Kindlmann; Eugenio Culurciello
2010
2010, vol.65, no.2
Comparison of high impedance input topologies with low EMI susceptibility
Fridolin Michel; Michiel Steyaert
2010
2010, vol.65, no.2
High frequency channel noise measurement and characterization in deep submicron MOSFETs
A. Allam; I. M. Filanovsky
2010
2010, vol.65, no.2
1
2
制造业外文文献服务平台