期刊


ISSN1047-4838
刊名JOM
参考译名矿物、金属与材料学会会刊
收藏年代1998～2024



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2010, vol.62, no.1 2010, vol.62, no.10 2010, vol.62, no.11 2010, vol.62, no.12 2010, vol.62, no.2 2010, vol.62, no.3
2010, vol.62, no.4 2010, vol.62, no.5 2010, vol.62, no.6 2010, vol.62, no.7 2010, vol.62, no.8 2010, vol.62, no.9

题名作者出版年年卷期
Characterization of Copper Nanoparticles Synthesized by a Novel Microbiological MethodRatnika Varshney; Seema Bhadauria; M. S. Gaur; Renu Pasricha20102010, vol.62, no.12
Get Involved: Megan Frary, Material Advantage AdvisorKelly Zappas20102010, vol.62, no.12
Out of Iowa: Students Learn Mere than Materials Engineering in MallLynne Robinson20102010, vol.62, no.12
Small-scale Materials Behavior from X-ray Microdiffraction and ImagingRozaliya I. Barabash; Gene E. Ice20102010, vol.62, no.12
Characterization of Polycrystalline Materials Using Synchrotron X-ray Imaging and Diffraction TechniquesW. Ludwig; A. King; M. Herbig; P. Reischig; J. Marrow; L. Babout; E. M. Lauridsen; H. Proudhon; J. Y. Buffiere20102010, vol.62, no.12
Measuring Depth-dependent Dislocation Densities and Elastic Strains in an Indented Ni-based SuperalloyO. M. Barabash; M. Santella; R. I. Barabash; G. E. Ice; J. Tischler20102010, vol.62, no.12
The Use of Laue Microdiffraction to Study Small-scale PlasticityH. Van Swygenhoven; S. Van Petegem20102010, vol.62, no.12
Revealing Plastic Deformation Mechanisms in Polycrystalline Thin Films with Synchrotron XRDRalph D. Nyilas; Stephan Frank; Ralph Spolenak20102010, vol.62, no.12
Solid State Interfaces: Toward an Atomistic-scale Understanding of Structure, Properties, and BehaviorD. L. Medlin; M. J. Demkowicz; E. A. Marquis20102010, vol.62, no.12
Atomic-scale STEM-EELS Mapping across Functional InterfacesChristian Colliex; Laura Bocher; Francisco de la Pena; Alexandre Gloter; Katia March; Michael Walls20102010, vol.62, no.12
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