期刊


ISSN0913-5685
刊名電子情報通信学会技術研究報告
参考译名电子信息通信学会技术研究报告：可靠性
收藏年代2000～2024



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题名作者出版年年卷期
Ni上Snやっき層のへら状成長物の要因とはんだ溶解性一考察伊藤貞則; 鈴木雅史20102010, vol.110, no.416
I_(DDQ)を用いたLSIの劣化兆候の検出坂本俊輔; 眞田克20102010, vol.110, no.416
電気接触部への潤滑剤塗布による摩擦係数の増加現象について玉井輝雄; 澤田滋; 服部康弘20102010, vol.110, no.416
初期故障率に基づく電子部品の統計的品質管理松岡敏成20102010, vol.110, no.416
定量位相差顕微鏡を用いた発熱計測技術の開発中村共則; 岩井秀直; 山内豊彦; 寺田浩敏20102010, vol.110, no.416
揮発ガス雰囲気中で動作するリレー接点の接触抵抗特性に関する実験的検討長谷川誠; 小林菜々絵; 河野良行20102010, vol.110, no.416
開放故障に伴う不安定論理の固定化安富泰輝; 眞田克20102010, vol.110, no.416
開離時アーク後の接点表面の接触抵抗分布測定山梨洋平; 宮司勝吉; 関川純哉; 窪野隆能20102010, vol.110, no.416
発光ダイオードを用いた接触領域内の電流直接観察筑地茂樹; 澤田滋; 玉井輝雄; 服部康弘; 飯田和生20102010, vol.110, no.416



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