期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2025



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024 2025

2010, vol.12, no.1 2010, vol.12, no.2 2010, vol.12, no.3 2010, vol.12, no.4

题名作者出版年年卷期
Wafer-Level Failure Analysis Process FlowJeng-Han Lee; Yung-Sheng Huang; David H. Su20102010, vol.12, no.2
Experiences with Layout-Aware Diagnosis - A Case StudyYi-Jung Chang; Man-Ting Pang; Mike Brennan; Albert Man; Martin Keim; Geir Eide; Brady Benware; Ting-Pu Tai20102010, vol.12, no.2
ISTFA 2009 User's Group 4 - "Fast ASIC Fault Isolation: Efficiency and Accurate Resolution of Software-Based Fault Isolation"Mark Kimball; Martin Keim20102010, vol.12, no.2
Test Processes for Optimal Yield, Reliability, and DiagnosisMatthias Kamm20102010, vol.12, no.2



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