期刊


ISSN0913-5685
刊名電子情報通信学会技術研究報告
参考译名电子信息通信学会技术研究报告：可靠性
收藏年代2000～2024



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2011, vol.111, no.102 2011, vol.111, no.103 2011, vol.111, no.106 2011, vol.111, no.108 2011, vol.111, no.109 2011, vol.111, no.111
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题名作者出版年年卷期
A Basic Study on Timing-Test Scheduling for Post-Silicon Skew TuningMineo KANEKO20112011, vol.111, no.324
An Improved Simulated Annealing for 3D Packing with Sequence Triple and Quintuple RepresentationsYiqiang SHENG; Atsushi TAKAHASHI; Shuichi UENO20112011, vol.111, no.324
A Dynamically Configurable NoC Test Access MechanismTakieddine SBIAI; Kazuteru NAMBA; Hideo ITO20112011, vol.111, no.324
外側ループシフトを使用した高位合成向け自動ループ融合加藤勇太; 瀬戸謙修; 丸泉琢也20112011, vol.111, no.324
高位合成に最適化されたコデザイン手法－Androidプラットフォームへの適用伊藤仁貴; 田中清史20112011, vol.111, no.324
テスト設計選択のためのLSI設計製造コストモデル志水昂; 岩垣剛; 市原英行; 井上智生20112011, vol.111, no.324
スキャンチェーンの再構成による千葉大スキャンテストデータ圧縮率向上手法赤川慎人; 難波一輝; 伊藤秀男20112011, vol.111, no.324
BASTにおけるテストデータ量を削減するためのスキャンチェインの接続法陳贇; 細川利典; 吉村正義20112011, vol.111, no.324
シフトレジスタ準等価な回路を用いたセキュアでテスト容易なスキャン設計について藤原克哉; 藤原秀雄; 玉本英夫20112011, vol.111, no.324
テストデータ量削減のための反転信号シフト型BAST構成とテストパターン生成法岡田靖彦; 四柳浩之; 橋爪正樹20112011, vol.111, no.324
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