期刊


ISSN1084-4309
刊名ACM Transactions on Design Automation of Electronic Systems
参考译名ACM电子系统自动化设计汇刊
收藏年代2000～2024



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2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2012, vol.17, no.1 2012, vol.17, no.2 2012, vol.17, no.3 2012, vol.17, no.4

题名作者出版年年卷期
A Fast Non-Monte-Carlo Yield Analysis and Optimization by Stochastic Orthogonal PolynomialsFANG GONG; XUEXIN LIU; HAO YU; SHELDON X. D. TAN; JUNYAN REN; LEI HE20122012, vol.17, no.1
Easy Formal Specification and Validation of Unbounded Networks-on-Chips ArchitecturesFREEK VERBEEK; JULIEN SCHMALTZ20122012, vol.17, no.1
System-Level Synthesis for Wireless Sensor Node Controllers: A Complete Design FlowMUHAMMAD ADEEL PASHA; STEVEN DERRIEN; OLIVIER SENTIEYS20122012, vol.17, no.1
Optimization Algorithms for the Multiplierless Realization of Linear TransformsLEVENT AKSOY; EDUARDO COSTA; PAULO FLORES; JOSE MONTEIRO20122012, vol.17, no.1
Postplacement Voltage Island GenerationMARIO K. Y. LEUNG; ERIC K. I. CHIO; EVANGELINE F. Y. YOUNG20122012, vol.17, no.1
Compact Modeling of Interconnect Circuits over Wide Frequency Band by Adaptive Complex-Valued Sampling MethodHAI WANG; SHELDON X. D. TAN; RYAN RAKIB20122012, vol.17, no.1
Reliability-Driven Power/Ground Routing for Analog ICsJING-WEI LIN; TSUNG-YI HO; IRIS HUI-RU JIANG20122012, vol.17, no.1
Coverage-Directed Test Generation Automated by Machine Learning - A ReviewCHARALAMBOS IOANNIDES; KERSTIN I. EDER20122012, vol.17, no.1
Error Rate Estimation for Defective Circuits via Ones CountingZHAOLIANG PAN; MELVIN A. BREUER20122012, vol.17, no.1
Statistical Soft Error Rate (SSER) Analysis for Scaled CMOS DesignsHUAN-KAI PENG; HSUAN-MING HUANG; YU-HSIN KUO; CHARLES H. P. WEN20122012, vol.17, no.1



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