期刊


ISSN0968-4328
刊名Micron
参考译名微米
收藏年代2002～2025



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2012, vol.43, no.1 2012, vol.43, no.10 2012, vol.43, no.11 2012, vol.43, no.12 2012, vol.43, no.2/3 2012, vol.43, no.4
2012, vol.43, no.5 2012, vol.43, no.6 2012, vol.43, no.7 2012, vol.43, no.8 2012, vol.43, no.9

题名作者出版年年卷期
Progress and problems for atomic-resolution electron microscopyDavid J. Smith20122012, vol.43, no.4
Model-based electron microscopy: From images toward precise numbers for unknown structure parametersS. Van Aert; W. Van den Broek; P. Goos; D. Van Dyck20122012, vol.43, no.4
Optimum correction conditions for aberration-corrected HRTEM SiC dumbbells chemical imagingMichael Texier; Jany Thibault-Penisson20122012, vol.43, no.4
Imaging from atomic structure to electronic structureQiang Xu; Henny W. Zandbergen; Dirk Van Dyck20122012, vol.43, no.4
Spatial resolution and radiation damage in quantitative high-resolution STEM-EEL spectroscopy in oxidesL. Houben; M. Heidelmann; F. Gunkel20122012, vol.43, no.4
Experimental study of annular bright field (ABF) imaging using aberration-corrected scanning transmission electron microscopy (STEM)Eiji Okunishi; Hidetaka Sawada; Yukihito Kondo20122012, vol.43, no.4
Performance and early applications of a versatile double aberration-corrected JEOL-2200FS FEG TEM/STEM at Aalto UniversityHua Jiang; Janne Ruokolainen; Neil Young; Tetsuo Oikawa; Albert G. Nasibulin; Angus Kirkland; Esko I. Kauppinen20122012, vol.43, no.4
Evaluation of probe size in STEM imaging at 30 and 60 kVTakeo Sasaki; Hidetaka Sawada; Eiji Okunishi; Fumio Hosokawa; Toshikatsu Kaneyama; Yukihito Kondo; Koji Kimoto; Kazu Suenaga20122012, vol.43, no.4
On the structure of bimetallic noble metal nanoparticles as revealed by aberration corrected scanning transmission electron microscopy (STEM)Alvaro Mayoral; Francis Leonard Deepak; Rodrigo Esparza; Gilberto Casillas; Cesar Magen; Eduardo Perez-Tijerina; Miguel Jose-Yacaman20122012, vol.43, no.4



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