期刊


ISSN1063-7397
刊名Russian Microelectronics
参考译名俄罗斯微电子学
收藏年代2002～2023



全部

2002 2003 2004 2005 2006 2007
2008 2009 2010 2011 2012 2013
2014 2015 2016 2017 2018 2019
2020 2021 2022 2023

2012, vol.41, no.1 2012, vol.41, no.2 2012, vol.41, no.3 2012, vol.41, no.4 2012, vol.41, no.5 2012, vol.41, no.7
2012, vol.41, no.8

题名作者出版年年卷期
Influence of Quantum Effects on Electron Transport in Molybdenum NanocontactsL. Fedichkin; A. Borisov; A. Konin; R. Petrukhnenko; M. Chernyshev; V. Rubaev20122012, vol.41, no.1
Influence of Optical Properties of the SOI Structure on the Wafer Temperature during Rapid Thermal AnnealingV. I. Rudakov; V. V. Ovcharov; V. P. Prigara20122012, vol.41, no.1
Interaction of Electromagnetic H-Wave with Thin Metal FilmA. V. Latyshev; A. A. Yushkanov20122012, vol.41, no.1
Diagnostics of Degradation Processes in the Metal-Semiconductor SystemA. A. Skvortsov; A. M. Orlov; S. M. Zuev20122012, vol.41, no.1
Probe Modification for Scanning-Probe Microscopy by the Focused Ion Beam MethodB. G. Konoplev; O. A. Ageev; V. A. Smirnov; A. S. Kolomiitsev; N. I. Serbu20122012, vol.41, no.1
Magnetization Oscillations in a Ferromagnet/Nonmagnetic Metal/Ferromagnet Nanostructure under the Action of the Spin-Polarized CurrentA. V. Kukharev; A. L. Danilyuk; V. E. Borisenko20122012, vol.41, no.1
Optimization of Parameters of Double-Gate Sub-20 Nanometers SOI CMOS Transistors with Architecture "without Overlapping"N. V. Masalsky20122012, vol.41, no.1
Estimating Energy Consumption in Logical CMOS Circuits Based on Their Switching ActivityP. N. Bibilo; N. A. Kirienko20122012, vol.41, no.1



制造业外文文献服务平台