期刊


ISSN0025-5327
刊名Materials Evaluation
参考译名材料评价
收藏年代1998～2024



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2012, vol.70, no.1 2012, vol.70, no.10 2012, vol.70, no.11 2012, vol.70, no.12 2012, vol.70, no.12 SUPPL. 2012, vol.70, no.2
2012, vol.70, no.3 2012, vol.70, no.4 2012, vol.70, no.5 2012, vol.70, no.5 SUPPL. 2012, vol.70, no.6 2012, vol.70, no.7
2012, vol.70, no.8 2012, vol.70, no.9

题名作者出版年年卷期
Time Reversal Focusing of Ultrasonic Array Transducers on a Side-drilled HoleHyunjo Jeong20122012, vol.70, no.9
Technique for Bonding FeCo Magnetostrictive Sensors to Components at Temperatures of Approximately 588 KDorian Matthews; Glenn Light20122012, vol.70, no.9
City Beautiful: ASNT Heads to Orlando for the 2012 ASNT Fall ConferenceToni Kervina20122012, vol.70, no.9
X-ray quality: X-ray beam quality evaluation of a linear acceleratorRyan McCurdy; Andrew Slayton; Chuck Sum; Phillip C. Berry20122012, vol.70, no.9
URING: Measurement System AnalysisHerb Robbins20122012, vol.70, no.9
Measuring Microfocal Spots using Digital RadiographyDavid Fry; Uwe Ewert; C. Gollwitzer; E. Neuser; J. Selling20122012, vol.70, no.8
Bad Pixel Management for Industrial InspectionDebasish Mishra; Clifford Bueno; G. K. Padmashree; Joe Portaz20122012, vol.70, no.8
Best Energy Selection for Different Applications with Digital Detector Arrays from 20 to 600 keVKlaus Bavendiek; Uwe Heike; Joseph M. Kosanetzky; Uwe Ewert; Uwe Zscherpel20122012, vol.70, no.8
Image Quality in Digital Industrial RadiographyUwe Ewert; Uwe Zscherpel; Klara Heyne; Mirko Jechow; Klaus Bavendiek20122012, vol.70, no.8
EPS approach: Equivalent Penetrameter Sensitivity as Applied to Computed RadiographyKen LaCivita; Uwe Ewert20122012, vol.70, no.8
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