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期刊
ISSN
1751-8601
刊名
IET Computers & Digital Techniques
参考译名
IET计算机与数字技术
收藏年代
2007~2012
关联期刊
参考译名
收藏年代
IEE Proceedings
英国电气工程师学会论文集:计算机与数字技术
1999~2006
全部
2007
2008
2009
2010
2011
2012
2012, vol.6, no.1
2012, vol.6, no.2
2012, vol.6, no.3
2012, vol.6, no.4
2012, vol.6, no.5
2012, vol.6, no.6
题名
作者
出版年
年卷期
Arithmetic module-based built-in self test architecture for two-pattern testing
I. Voyiatzis; C. Efstathiou; H. Antonopoulou; A. Milidonis
2012
2012, vol.6, no.4
Multi-objective optimisations for a superscalar architecture with selective value prediction
A. Gellert; H. Calborean; L. Vintan; A. Florea
2012
2012, vol.6, no.4
Efficient post-configuration testing of an asynchronous nanowire crossbar system for reliability
J. S. Lee; S. Venkateswaran; M. Choi
2012
2012, vol.6, no.4
Functional broadside tests for embedded logic blocks
I. Pomeranz
2012
2012, vol.6, no.4
Reset and partial-reset-based functional broadside tests
I. Pomeranz; S. M. Reddy
2012
2012, vol.6, no.4
Design of experiments and integer linear programming-assisted conjugate-gradient optimisation of high-kappa/metal-gate nano-complementary metal-oxide semiconductor static random access memory
S. P. Mohanty; E. Kougianos
2012
2012, vol.6, no.4
FPGA accelerator for floating-point matrix multiplication
Z. Jovanovic; V. Milutinovic
2012
2012, vol.6, no.4
Arithmetic module-based built-in self test architecture for two-pattern testing
I. Voyiatzis; C. Efstathiou; H. Antonopoulou; A. Milidonis
2012
2012, vol.6, no.4
Multi-objective optimisations for a superscalar architecture with selective value prediction
A. Gellert; H. Calborean; L. Vintan; A. Florea
2012
2012, vol.6, no.4
Efficient post-configuration testing of an asynchronous nanowire crossbar system for reliability
J. S. Lee; S. Venkateswaran; M. Choi
2012
2012, vol.6, no.4
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