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期刊
ISSN
1043-7398
刊名
Journal of Electronic Packaging
参考译名
电子封装杂志;美国机械工程师学会汇刊
收藏年代
1995~2024
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2013, vol.135, no.1
2013, vol.135, no.2
2013, vol.135, no.3
2013, vol.135, no.4
题名
作者
出版年
年卷期
Two-Phase Liquid Cooling for Thermal Management of IGBT Power Electronic Module
Peng Wang; Patrick McCluskey; Avram Bar-Cohen
2013
2013, vol.135, no.2
Study on Heat Conduction in a Simulated Multicore Processor Chip - Part I: Analytical Modeling
Wataru Nakayama
2013
2013, vol.135, no.2
Study on Heat Conduction in a Simulated Multicore Processor Chip - Part II: Case Studies
Wataru Nakayama
2013
2013, vol.135, no.2
Effect of Joint Size on Microstructure and Growth Kinetics of Intermetallic Compounds in Solid-Liquid Interdiffusion Sn3.5Ag/Cu-Substrate Solder Joints
Ousama M. Abdelhadi; Leila Ladani
2013
2013, vol.135, no.2
Promising Technology for Electronic Cooling: Nanofluidic Micro Pulsating Heat Pipes
Kambiz Jahani; Maziar Mohammadi; Mohammad Behshad Shafii; Zahra Shiee
2013
2013, vol.135, no.2
Effect of Indium Content on the Melting Point, Dross, and Oxidation Characteristics of Sn-2Ag-3Bi-xln Solders
Ae-Jeong Jeon; Seong-Jun Kim; Sang-Hoon Lee; Chung-Yun Kang
2013
2013, vol.135, no.2
Development of Accelerated Method for Thermal Cycling in Electronic Packaging Application
Michael Mayer; Michael McCracken; John Persic
2013
2013, vol.135, no.2
Comparative Study of Thermal Performance of Longitudinal and Transversal-Wavy Microchannel Heat Sinks for Electronic Cooling
Gongnan Xie; Jian Liu; Yanquan Liu; Bengt Sunden; Weihong Zhang
2013
2013, vol.135, no.2
Application of Kriging and Radial Basis Function for Reliability Optimization in Power Modules
Pushparajah Rajaguru; Stoyan Stoyanov; Hua Lu; Chris Bailey
2013
2013, vol.135, no.2
Reliability Assessment and Activation Energy Study of Au and Pd-Coated Cu Wires Post High Temperature Aging in Nanoscale Semiconductor Packaging
C. L. Gan; U. Hashim
2013
2013, vol.135, no.2
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