期刊


ISSN0913-5685
刊名電子情報通信学会技術研究報告
参考译名电子信息通信学会技术研究报告:可靠性
收藏年代2000~2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2013, vol.113, no.1 2013, vol.113, no.100 2013, vol.113, no.107 2013, vol.113, no.11 2013, vol.113, no.110 2013, vol.113, no.112
2013, vol.113, no.116 2013, vol.113, no.118 2013, vol.113, no.119 2013, vol.113, no.12 2013, vol.113, no.126 2013, vol.113, no.128
2013, vol.113, no.13 2013, vol.113, no.134 2013, vol.113, no.135 2013, vol.113, no.141 2013, vol.113, no.142 2013, vol.113, no.143
2013, vol.113, no.144 2013, vol.113, no.149 2013, vol.113, no.15 2013, vol.113, no.153 2013, vol.113, no.162 2013, vol.113, no.163
2013, vol.113, no.164 2013, vol.113, no.167 2013, vol.113, no.17 2013, vol.113, no.171 2013, vol.113, no.172 2013, vol.113, no.173
2013, vol.113, no.174 2013, vol.113, no.177 2013, vol.113, no.185 2013, vol.113, no.186 2013, vol.113, no.187 2013, vol.113, no.188
2013, vol.113, no.189 2013, vol.113, no.19 2013, vol.113, no.190 2013, vol.113, no.195 2013, vol.113, no.199 2013, vol.113, no.201
2013, vol.113, no.202 2013, vol.113, no.204 2013, vol.113, no.216 2013, vol.113, no.217 2013, vol.113, no.224 2013, vol.113, no.225
2013, vol.113, no.228 2013, vol.113, no.231 2013, vol.113, no.232 2013, vol.113, no.235 2013, vol.113, no.236 2013, vol.113, no.238
2013, vol.113, no.242 2013, vol.113, no.247 2013, vol.113, no.249 2013, vol.113, no.250 2013, vol.113, no.251 2013, vol.113, no.253
2013, vol.113, no.26 2013, vol.113, no.260 2013, vol.113, no.261 2013, vol.113, no.263 2013, vol.113, no.264 2013, vol.113, no.268
2013, vol.113, no.27 2013, vol.113, no.271 2013, vol.113, no.272 2013, vol.113, no.278 2013, vol.113, no.283 2013, vol.113, no.284
2013, vol.113, no.289 2013, vol.113, no.290 2013, vol.113, no.296 2013, vol.113, no.298 2013, vol.113, no.299 2013, vol.113, no.30
2013, vol.113, no.307 2013, vol.113, no.313 2013, vol.113, no.317 2013, vol.113, no.319 2013, vol.113, no.320 2013, vol.113, no.322
2013, vol.113, no.323 2013, vol.113, no.326 2013, vol.113, no.330 2013, vol.113, no.331 2013, vol.113, no.333 2013, vol.113, no.337
2013, vol.113, no.341 2013, vol.113, no.342 2013, vol.113, no.343 2013, vol.113, no.347 2013, vol.113, no.348 2013, vol.113, no.349
2013, vol.113, no.350 2013, vol.113, no.351 2013, vol.113, no.352 2013, vol.113, no.354 2013, vol.113, no.359 2013, vol.113, no.365
2013, vol.113, no.369 2013, vol.113, no.370 2013, vol.113, no.379 2013, vol.113, no.383 2013, vol.113, no.394 2013, vol.113, no.395
2013, vol.113, no.396 2013, vol.113, no.397 2013, vol.113, no.40 2013, vol.113, no.401 2013, vol.113, no.41 2013, vol.113, no.411
2013, vol.113, no.412 2013, vol.113, no.413 2013, vol.113, no.416 2013, vol.113, no.419 2013, vol.113, no.420 2013, vol.113, no.425
2013, vol.113, no.426 2013, vol.113, no.427 2013, vol.113, no.433 2013, vol.113, no.437 2013, vol.113, no.438 2013, vol.113, no.439
2013, vol.113, no.44 2013, vol.113, no.440 2013, vol.113, no.445 2013, vol.113, no.448 2013, vol.113, no.45 2013, vol.113, no.450
2013, vol.113, no.451 2013, vol.113, no.454 2013, vol.113, no.460 2013, vol.113, no.462 2013, vol.113, no.463 2013, vol.113, no.467
2013, vol.113, no.468 2013, vol.113, no.47 2013, vol.113, no.474 2013, vol.113, no.477 2013, vol.113, no.48 2013, vol.113, no.481
2013, vol.113, no.483 2013, vol.113, no.484 2013, vol.113, no.486 2013, vol.113, no.49 2013, vol.113, no.491 2013, vol.113, no.501
2013, vol.113, no.503 2013, vol.113, no.53 2013, vol.113, no.58 2013, vol.113, no.68 2013, vol.113, no.69 2013, vol.113, no.70
2013, vol.113, no.72 2013, vol.113, no.73 2013, vol.113, no.74 2013, vol.113, no.77 2013, vol.113, no.78 2013, vol.113, no.80
2013, vol.113, no.81 2013, vol.113, no.82 2013, vol.113, no.87 2013, vol.113, no.96 2013, vol.113, no.97 2013, vol.113, no.99

题名作者出版年年卷期
Impacts of Channel Doping on Random Telegraph Signal Noise and Successful Noise Suppression by Mobility EnhancementJ. Chen; Y. Higashi; I. Hirano; Y. Mitani20132013, vol.113, no.296
2013 SISPADレビュー~輸送,信頼性森伸也20132013, vol.113, no.296
低温RTAにおけるSi中のSの挙動とS2形成の原子レベルシミュレーション金村貴永; 加藤弘一; 谷本弘吉; 青木伸俊; 豊島義明20132013, vol.113, no.296
窒化シリコン中の窒素空孔に導入された元素が電子トラップ準位に与える影響園田賢一郎; 佃栄次; 谷沢元昭; 石川清志; 山口泰男20132013, vol.113, no.296
シリコントライゲートナノワイヤトランジスタの低周波ノイズ特性解析齋藤真澄; 太田健介; 田中千加; 沼田敏典20132013, vol.113, no.296
量子エネルギー輸送モデルを用いた先端MOSFETシミュレーション鍾菁廣; 小田中紳二20132013, vol.113, no.296
シリコンナノワイヤトランジスタの解析的ドレイン電流モデルとデバイス設計田中千加; 萩島大輔; 内田建; 沼田敏典20132013, vol.113, no.296
DIBL効果を取り入れた弾道·準弾道GAA-MOSFSETのコンパクトモデル程賀; 宇野重康; 中里和郎20132013, vol.113, no.296
Pt/TiO_2/Pt系の抵抗変化現象の物理モデルとシミュレーションによる検証大村泰久; 近藤祐介20132013, vol.113, no.296
Double-gate Lateral Tunnel FETのデバイスモデル大村泰久; 佐藤大貴; 佐藤伸吾; Abhijit Mallik20132013, vol.113, no.296
12