期刊


ISSN0913-5685
刊名電子情報通信学会技術研究報告
参考译名电子信息通信学会技术研究报告:可靠性
收藏年代2000~2024



全部

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2006 2007 2008 2009 2010 2011
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2018 2019 2020 2021 2022 2023
2024

2014, vol.114, no.1 2014, vol.114, no.10 2014, vol.114, no.100 2014, vol.114, no.102 2014, vol.114, no.11 2014, vol.114, no.111
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题名作者出版年年卷期
Sn/Geコンタクトにおけるフェルミレベルピニング現象の軽減鈴木陽洋; 朝羽俊介; 横井淳; 黒澤昌志; 加藤公彦; 坂下満男; 田岡紀之; 中塚理; 財満鎮明20142014, vol.114, no.88
極薄EOT high-k/Geゲートスタックの熱安定性及び界面特性改善に向けたプロセス設計淺原亮平; 細井卓治; 志村考功; 渡部平司20142014, vol.114, no.88
金属/Ge界面における空孔欠陥の安定性-第一原理計算による検討佐々木奨悟; 中山隆史20142014, vol.114, no.88
Ge_(1-x)Sn_xエピタキシャル成長における積層欠陥構造の制御浅野孝典; 田岡紀之; 中塚理; 財満鎮明20142014, vol.114, no.88
Ge基板中のAs高効率活性化と低抵抗浅接合形成浜田慎也; 村上秀樹; 小野貫寛; 橋本邦明; 大田晃生; 花房宏明; 東清一郎; 宮崎誠一20142014, vol.114, no.88
ALD法で作製したAl_2O_3/(Ta/Nb)O_x/Al_2O_3多層構造のチャージトラップフラッシュメモリーの評価生田目俊秀; 大井暁彦; 伊藤和博; 高橋誠; 知京豊裕20142014, vol.114, no.88
Mnナノドットを埋め込んだNi/SiO_x/Ni構造の抵抗変化特性荒井崇; 大田晃生; 牧原克典; 宮崎誠一20142014, vol.114, no.88
p-Cu_2O/SiO_x/n-SiC構造pnメモリダイオードの低温形成山下敦史; 塚本貴広; 須田良幸20142014, vol.114, no.88
第一原理計算を用いたSi-rich SiO_2への水素·窒素原子の混入による影響の原子論的考察白川裕規; 山口慶太; 神谷克政; 白石賢二20142014, vol.114, no.88
ナノ構造中における電子輸送の理論的研究藤田弦暉; 塩川太郎; 高田幸宏; 小鍋哲; 村口正和; 山本貴博; 遠藤哲郎; 初貝安弘; 白石賢二20142014, vol.114, no.88
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