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期刊
ISSN
1084-4309
刊名
ACM Transactions on Design Automation of Electronic Systems
参考译名
ACM电子系统自动化设计汇刊
收藏年代
2000~2024
全部
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2015, vol.20, no.1
2015, vol.20, no.2
2015, vol.20, no.3
2015, vol.20, no.4
题名
作者
出版年
年卷期
Single-Event Multiple-Transient Characterization and Mitigation via Alternative Standard Cell Placement Methods
Kiddie, Bradley T.; Robinson, William H.; Limbrick, Daniel B.
2015
2015, vol.20, no.4
Introduction to the Special Issue on Reliable, Resilient, and Robust Design of Circuits and Systems
Xie, Yuan; Bahar, R. Iris; Jones, Alex K.
2015
2015, vol.20, no.4
Built-In Self-Test and Test Scheduling for Interposer-Based 2.5D IC
Wang, Ran; Chakrabarty, Krishnendu; Bhawmik, Sudipta
2015
2015, vol.20, no.4
FOLD: Extreme Static Test Compaction by Folding of Functional Test Sequences
Pomeranz, Irith
2015
2015, vol.20, no.4
Fast Simulation of Networks-on-Chip with Priority-Preemptive Arbitration
Indrusiak, Leandro Soares; Harbin, James; Dos Santos, Osmar Marchi
2015
2015, vol.20, no.4
Architecting the Last-Level Cache for GPUs using STT-RAM Technology
Samavatian, Mohammad Hossein; Arjomand, Mohammad; Bashizade, Ramin; Sarbazi-Azad, Hamid
2015
2015, vol.20, no.4
Implementing an Application-Specific Instruction-Set Processor for System-Level Dynamic Program Analysis Engines
Heo, Ingoo; Kim, Minsu; Lee, Yongje; Choi, Changho; Lee, Jinyong; Kang, Brent Byunghoon; Paek, Yunheung
2015
2015, vol.20, no.4
Accurate Analysis and Prediction of Enterprise Service-Level Performance
Duan, Qing; Koneru, Abhishek; Zeng, Jun; Chakrabarty, Krishnendu; Dispoto, Gary
2015
2015, vol.20, no.4
Use It or Lose It: Proactive, Deterministic Longevity in Future Chip Multiprocessors
Kim, Hyungjun; Boga, Siva Bhanu Krishna; Vitkovskiy, Arseniy; Hadjitheophanous, Stavros; Gratz, Paul V.; Soteriou, Vassos; Michael, Maria K.
2015
2015, vol.20, no.4
Impact of Cell Failure on Reliable Cross-Point Resistive Memory Design
Yu, Shimeng; Xie, Yuan; Xu, Cong; Niu, Dimin; Zheng, Yang
2015
2015, vol.20, no.4
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