期刊


ISSN1084-4309
刊名ACM Transactions on Design Automation of Electronic Systems
参考译名ACM电子系统自动化设计汇刊
收藏年代2000~2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

2015, vol.20, no.1 2015, vol.20, no.2 2015, vol.20, no.3 2015, vol.20, no.4

题名作者出版年年卷期
Single-Event Multiple-Transient Characterization and Mitigation via Alternative Standard Cell Placement MethodsKiddie, Bradley T.; Robinson, William H.; Limbrick, Daniel B.20152015, vol.20, no.4
Introduction to the Special Issue on Reliable, Resilient, and Robust Design of Circuits and SystemsXie, Yuan; Bahar, R. Iris; Jones, Alex K.20152015, vol.20, no.4
Built-In Self-Test and Test Scheduling for Interposer-Based 2.5D ICWang, Ran; Chakrabarty, Krishnendu; Bhawmik, Sudipta20152015, vol.20, no.4
FOLD: Extreme Static Test Compaction by Folding of Functional Test SequencesPomeranz, Irith20152015, vol.20, no.4
Fast Simulation of Networks-on-Chip with Priority-Preemptive ArbitrationIndrusiak, Leandro Soares; Harbin, James; Dos Santos, Osmar Marchi20152015, vol.20, no.4
Architecting the Last-Level Cache for GPUs using STT-RAM TechnologySamavatian, Mohammad Hossein; Arjomand, Mohammad; Bashizade, Ramin; Sarbazi-Azad, Hamid20152015, vol.20, no.4
Implementing an Application-Specific Instruction-Set Processor for System-Level Dynamic Program Analysis EnginesHeo, Ingoo; Kim, Minsu; Lee, Yongje; Choi, Changho; Lee, Jinyong; Kang, Brent Byunghoon; Paek, Yunheung20152015, vol.20, no.4
Accurate Analysis and Prediction of Enterprise Service-Level PerformanceDuan, Qing; Koneru, Abhishek; Zeng, Jun; Chakrabarty, Krishnendu; Dispoto, Gary20152015, vol.20, no.4
Use It or Lose It: Proactive, Deterministic Longevity in Future Chip MultiprocessorsKim, Hyungjun; Boga, Siva Bhanu Krishna; Vitkovskiy, Arseniy; Hadjitheophanous, Stavros; Gratz, Paul V.; Soteriou, Vassos; Michael, Maria K.20152015, vol.20, no.4
Impact of Cell Failure on Reliable Cross-Point Resistive Memory DesignYu, Shimeng; Xie, Yuan; Xu, Cong; Niu, Dimin; Zheng, Yang20152015, vol.20, no.4
12345678910