期刊


ISSN0968-4328
刊名Micron
参考译名微米
收藏年代2002～2025



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2002 2003 2004 2005 2006 2007
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2015, vol.68 2015, vol.68, no. 2015, vol.69 2015, vol.69, no. 2015, vol.70 2015, vol.70, no.
2015, vol.71 2015, vol.71, no. 2015, vol.72 2015, vol.73 2015, vol.74 2015, vol.75
2015, vol.76 2015, vol.77 2015, vol.78 2015, vol.79

题名作者出版年年卷期
alpha-Actinin involvement in Z-disk assembly during skeletal muscle C2C12 cells in vitro differentiationSalucci, S.; Baldassarri, V.; Falcieri, E.; Burattini, S.20152015, vol.68, no.
Non-rigid landmark-based large-scale image registration in 3-D reconstruction of mouse and rat kidney nephronsZhang, Yan-Ling; Chang, Shi-Jie; Zhai, Xiao-Yue; Thomsen, Jesper Skovhus; Christensen, Erik I.; Andreasen, Arne20152015, vol.68, no.
Special Section on Electron-Beam Irradiation Effects, Modifications and Control PrefaceBotton, G. A.; Calderon, H. A.; Kisielowski, C.20152015, vol.68, no.
Mitochondrial and peroxisomal population in post-pharyngeal glands of leaf-cutting ants after lipid supplementationVieira, Alexsandro Santana; Bueno, Odair Correa20152015, vol.68, no.
Localization microscopy (SPDM) facilitates high precision control of lithographically produced nanostructuresGrab, A. L.; Hagmann, M.; Dahint, R.; Cremer, C.20152015, vol.68, no.
Scanning probe microscopy investigations of the electrical properties of chemical vapor deposited graphene grown on a 6H-SiC substrateGajewski, Krzysztof; Kopiec, Daniel; Moczala, Magdalena; Piotrowicz, Adam; Zielony, Michal; Wielgoszewski, Grzegorz; Gorszalk, Teodor; Strupinski, Wlodek20152015, vol.68, no.
One-step synthesis of a suspended ultrathin graphene oxide film: Application in transmission electron microscopyKirilenko, D. A.; Dideykin, A. T.; Aleksenskiy, A. E.; Sitnikova, A. A.; Konnikov, S. G.; Vul', A. Ya.20152015, vol.68, no.
Does autophagy in the midgut epithelium of centipedes depend on the day/night cycle?Rost-Roszkowska, M. M.; Chajec, L.; Vilimova, J.; Tajovsky, K.; Kszuk-Jendrysik, M.20152015, vol.68, no.
Damage behavior and atomic migration in MgAl2O4 under an 80 keV scanning focused probe in a STEMZhu, Guo-zhen; Botton, Gianluigi A.20152015, vol.68, no.
Advanced fabrication process for combined atomic force-scanning electrochemical microscopy (AFM-SECM) probesEifert, Alexander; Mizaikoff, Boris; Kranz, Christine20152015, vol.68, no.
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