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期刊
ISSN
0968-4328
刊名
Micron
参考译名
微米
收藏年代
2002~2025
全部
2002
2003
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2005
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2009
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2025
2016, vol.80
2016, vol.81
2016, vol.82
2016, vol.83
2016, vol.84
2016, vol.85
2016, vol.86
2016, vol.87
2016, vol.88
2016, vol.89
2016, vol.90
2016, vol.91
题名
作者
出版年
年卷期
Using hydrogels in microscopy: A tutorial
Flood, Peter; Page, Henry; Reynaud, Emmanuel G.
2016
2016, vol.84
Sinusoidal obstruction syndrome (SOS): A light and electron microscopy study in human liver
Vreuls, C. P. H.; Driessen, A.; Damink, S. W. M. Olde; Koek, G. H.; Duimel, H.; van den Broek, M. A. J.; Dejong, C. H. C.; Braet, F.; Wisse, E.
2016
2016, vol.84
Overview of chemical imaging methods to address biological questions
da Cunha, Marcel Menezes Lyra; Trepout, Sylvain; Messaoudi, Cedric; Wu, Ting-Di; Ortega, Richard; Guerquin-Kern, Jean-Luc; Marco, Sergio
2016
2016, vol.84
Electron energy loss spectroscopy analysis of the interaction of Cr and V with MWCNTs
Ilari, Gabriele M.; Chawla, Vipin; Matam, Santhosh; Zhang, Yucheng; Michler, Johann; Erni, Rolf
2016
2016, vol.84
M23C6 carbides and Cr2N nitrides in aged duplex stainless steel: A SEM, TEM and FIB tomography investigation
Maetz, J. -Y.; Douillard, T.; Verdu, C.; Kleber, X.; Cazottes, S.
2016
2016, vol.84
3D scanning electron microscopy applied to surface characterization of fluorosed dental enamel
Limandri, Silvina; Galvan Josa, Victor; Cecilia Valentinuzzi, Maria; Emilia Chena, Maria; Castellano, Gustavo
2016
2016, vol.84
Correlated light and electron microscopy observations of the uterine epithelial cell actin cytoskeleton using fluorescently labeled resin-embedded sections
Moore, Chad L.; Cheng, Delfine; Shami, Gerald J.; Murphy, Christopher R.
2016
2016, vol.84
Imaging of Norway spruce early somatic embryos with the ESEM, Cryo-SEM and laser scanning microscope
Nedela, Vilem; Hrib, Jiri; Havel, Ladislav; Hudec, Jiri; Runstuk, Jiri
2016
2016, vol.84
Microstructure, crystallography and diagenetic alteration in fossil ostrich eggshells from Upper Palaeolithic sites of Indian peninsular region
Bajpai, Sunil; Kumar, Giriraj; Jain, Sonal; Pruthi, Vikas
2016
2016, vol.84
Measurement of steep edges and undercuts in confocal microscopy
Mueller, T.; Jordan, M.; Schneider, T.; Poesch, A.; Reithmeier, E.
2016
2016, vol.84
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