期刊


ISSN0968-4328
刊名Micron
参考译名微米
收藏年代2002～2025



全部

2002 2003 2004 2005 2006 2007
2008 2009 2010 2011 2012 2013
2014 2015 2016 2017 2018 2019
2020 2021 2022 2023 2024 2025

2016, vol.80 2016, vol.81 2016, vol.82 2016, vol.83 2016, vol.84 2016, vol.85
2016, vol.86 2016, vol.87 2016, vol.88 2016, vol.89 2016, vol.90 2016, vol.91

题名作者出版年年卷期
A closer look at the feather coloration in the male purple sunbird, Nectarinia asiaticaMahapatra, Biswa Bhusana; Marathe, Sandhya Amol; Meyer-Rochow, Victor Benno; Mishra, Monalisa20162016, vol.85
Cutinsomes and cuticle enzymes GPAT6 and DGAT2 seem to,travel together from a lipotubuloid metabolon (LM) to extracellular matrix of O. umbellatum ovary epidermisStepinski, Dariusz; Kwiatkowska, Maria; Poplonska, Katarzyna; Polit, Justyna T.; Wojtczak, Agnieszka; Dominguez, Eva; Heredia, Antonio20162016, vol.85
High speed indentation measures by FV, QI and QNM introduce a new understanding of bionanomechanical experimentsSmolyakov, G.; Formosa-Dague, C.; Severac, C.; Duval, R. E.; Dague, E.20162016, vol.85
Grinding and polishing instead of sectioning for the tissue samples with a graft: Implications for light and electron microscopyMukhamadiyarov, Rinat A.; Sevostyanova, Victoria V.; Shishkova, Dania K.; Nokhrin, Andrey V.; Sidorova, Olga D.; Kutikhin, Anton G.20162016, vol.85
ANXA2 enhances the progression of hepatocellular carcinoma via remodeling the cell motility associated structuresShi, Hongyan; Xiao, Li; Duan, Wei; He, Huimin; Ma, Lele; Da, Miaomiao; Duan, Yan; Wang, Qian; Wu, Huayi; Song, Xigui; Hou, Yingchun20162016, vol.85
New insight on the underdrawing of 16th Flemish-Portuguese easel paintings by combined surface analysis and microanalytical techniquesValadas, S.; Freire, R.; Cardoso, A.; Mirao, J.; Vandenabeele, P.; Caetano, J. O.; Candeias, A.20162016, vol.85
Accuracy evaluation of an X-ray microtomography systemFernandes, Jaquiel S.; Appoloni, Carlos R.; Fernandes, Celso P.20162016, vol.85
Shell thickness determination of polymer-shelled microbubbles using transmission electron microscopyHarmark, Johan; Hebert, Hans; Koeck, Philip J. B.20162016, vol.85



制造业外文文献服务平台