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期刊
ISSN
8756-6990
刊名
Optoelectronics, Instrumentation and Data Processing
参考译名
光电子学、仪表与数据处理
收藏年代
2000~2023
全部
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2023
2016, vol.52, no.1
2016, vol.52, no.2
2016, vol.52, no.3
2016, vol.52, no.4
2016, vol.52, no.5
2016, vol.52, no.6
题名
作者
出版年
年卷期
Analysis of Random Point Images with the Use of Symbolic Computation Codes and Generalized Catalan Numbers
A. L. Reznik; A. V. Tuzikov; A. A. Solov'ev; A. V. Torgov
2016
2016, vol.52, no.6
Methods of Image Reconstruction and Hardware Function Evaluation Based on a Thinned Observation Matrix
V. K. Klochko; V. P. Kuznetsov
2016
2016, vol.52, no.6
Measuring Information Signal Parameters under Additive Non-Gaussian Correlated Noise
V. M. Artyushenko; V. I. Volovach
2016
2016, vol.52, no.6
Comparative Analysis of the Performance of Laser Doppler Systems using Maximum Likelihood and Phase Increment Methods
V. S. Sobolev; F. A. Zhuravel'; G. A. Kashcheeva
2016
2016, vol.52, no.6
Development of Active Filtering Algorithms for Higher Harmonics in Electrical Power Circuits
O. V. Nos; S. V. Brovanov; M. A. Dybko
2016
2016, vol.52, no.6
Spectral Method for Processing Signals of a High-Accuracy Laser Radar
A. V. Klimov; V. G. Glavnyi; G. V. Bakakin; V. G. Meledin
2016
2016, vol.52, no.6
Calculation of the Object Edge Position after Its Projection in a Spatially Noninvariant Coherent Optical System
Yu. V. Chugui
2016
2016, vol.52, no.6
Boson Peak in Low-Frequency Raman Spectra of Polymethylmethacrylate
M. A. Korshunov; V. F. Shabanov
2016
2016, vol.52, no.6
Measurement of the Characteristics of Ultrahigh-Frequency Optical Modulators by a Scanning Interferometer
S. N. Atutov; S. L. Mikerin; A. E. Simanchuk; V. A. Sorokin; A. I. Plekhanov
2016
2016, vol.52, no.6
Optoelectronic Scanning System Upgrade by Energy Center Localization Methods
W. Flores-Fuentes; O. Sergiyenko; J. C. Rodriguez-Quinonez; M. Rivas-Lopez; D. Hernandez-Balbuena; L. C. Basaca-Preciado; L. Lindner; F. F. Gonzalez-Navarro
2016
2016, vol.52, no.6
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