期刊


ISSN0913-5685
刊名電子情報通信学会技術研究報告
参考译名电子信息通信学会技术研究报告:可靠性
收藏年代2000~2024



全部

2000 2001 2002 2003 2004 2005
2006 2007 2008 2009 2010 2011
2012 2013 2014 2015 2016 2017
2018 2019 2020 2021 2022 2023
2024

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题名作者出版年年卷期
Pinning Voltage Control of CMOS Image Sensor by Measuring Sheet Resistance at Micro Test Structure in Scribe LineYotaro Goto; Tadashi Yamaguchi; Masazumi Matsuura; Koji Iizuka20172017, vol.117, no.260
Experimental Investigation of Localized Stress Induced Leakage Current Distribution and Its Decrease by Atomically Flattening ProcessHyeonwoo PARK; Rihito KURODA; Tetsuya GOTO; Tomoyuki SUWA; Akinobu TERAMOTO; Daiki KIMOTO; Shigetoshi SUGAWA20172017, vol.117, no.260
化学酸化膜を用いたAr/H_2熱処理によるSi表面原子レベル平坦化とHf系MONOS構造への応用工藤聡也; 大見俊一郎20172017, vol.117, no.260
[招待講演]段差ゼロの平坦化技術:CMP前のPMD体積調整掛川智康; 二瀬卓也20172017, vol.117, no.260
塗布型拡散剤を用いたnm対応コンフォーマルドーピング技術木下哲郎; 真下峻一; 大橋卓矢; 澤田佳宏; 木下洋平; 藤村悟史20172017, vol.117, no.260
[招待講演]HfO_2をゲート絶縁膜に用いたペンタセンOFETのデバイス特性に関する検討前田康貴; 劉野原; 廣木瑞葉; 大見俊一郎20172017, vol.117, no.260
ビックデータの活用によるメモリ製造革新-半導体製造の歩留解析支援システム赤堀浩史; 中田康太; 折原良平; 水岡良彰; 高木健太郎; 門多健一; 西村孝治; 田中祐加子; 江口英孝20172017, vol.117, no.260
紫外吸光とチャージアンプ回路を用いた高感度·小型リアルタイムガス濃度計石井秀和; 永瀬正明; 池田信一; 志波良信; 白井泰雪; 黒田理人; 須川成利20172017, vol.117, no.260
ZrO_2シード層がHf_xZr_(1-x)O_2薄膜の強誘電性へ及ぼす効果女屋崇; 生田目俊秀; 澤本直美; 大井暁彦; 池田直樹; 知京豊裕; 小椋厚志20172017, vol.117, no.260
[依頼講演]28nmスプリットゲートMONOS型フラッシュメモリを用いた高温動作かつ低エラー率を実現するPUF技術下井貴裕; 斉藤朋也; 長瀬寛和; 伊豆名雅之; 神田明彦; 伊藤孝; 河野隆司20172017, vol.117, no.260
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