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期刊
ISSN
1063-7397
刊名
Russian Microelectronics
参考译名
俄罗斯微电子学
收藏年代
2002~2023
全部
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2018, vol.47, no.1
2018, vol.47, no.2
2018, vol.47, no.3
2018, vol.47, no.4
2018, vol.47, no.5
2018, vol.47, no.6
2018, vol.47, no.7
2018, vol.47, no.8
题名
作者
出版年
年卷期
Geometric Effects in Current-Voltage Characteristics of a Cross-Shaped MDM Ni/NiO/Fe Structure
I. V. Malikov; V. A. Berezin; L. A. Fomin; G. M. Mikhailov
2018
2018, vol.47, no.3
Laser Method of Evaluating Parameters of LSI Sensitivity to the Impact of Single Ions
A. I. Chumakov
2018
2018, vol.47, no.3
Finite Element Simulation of Frequency Response of MEMS-Microphone
D. M. Grigor’ev; I. V. Godovitsyn; V. V. Amelichev; S. S. Generalov
2018
2018, vol.47, no.3
Investigating the Dynamic Characteristics of High-Temperature SOI CMOS VLSIC Elements
A. S. Benediktov; N. A. Shelepin; P. V. Ignatov; A. A. Mikhailov; A. G. Potupchik
2018
2018, vol.47, no.3
Magnetic Force Microscopy of Iron and Nickel Nanowires Fabricated by the Matrix Synthesis Technique
D. A. Bizyaev; A. A. Bukharaev; R. I. Khaibullin; N. M. Lyadov; D. L. Zagorskii; S. A. Bedin; I. M. Doludenko
2018
2018, vol.47, no.3
Helium Bubbles Formed in Si(001) Layers after High-Dose Implantation and Thermal Annealing
A. A. Lomov; A. V. Myakonkikh; Yu. M. Chesnokov
2018
2018, vol.47, no.3
Dependence of the Resistance of the Negative e-Beam Resist HSQ Versus the Dose in the RIE and Wet Etching Processes
A. V. Miakonkikh; N. A. Orlikovskiy; A. E. Rogozhin; A. A. Tatarintsev; K. V. Rudenko
2018
2018, vol.47, no.3
Calculating the High-Frequency Electrical Conductivity of a Thin Metallic Layer for an Ellipsoidal Fermi Surface
I. A. Kuznetsova; D. N. Romanov; A. A. Yushkanov
2018
2018, vol.47, no.3
Experimental Evaluation of Reliability of Deep Submicron SOI MOS Transistors at High Temperatures
A. S. Benediktov; N. A. Shelepin; P. V. Ignatov
2018
2018, vol.47, no.3
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