知识中心主页
文献服务
文献资源
外文期刊
外文会议
专业机构
智能制造
高级检索
版权声明
使用帮助
期刊
ISSN
1084-4309
刊名
ACM Transactions on Design Automation of Electronic Systems
参考译名
ACM电子系统自动化设计汇刊
收藏年代
2000~2024
全部
2000
2001
2002
2003
2004
2005
2006
2007
2008
2009
2010
2011
2012
2013
2014
2015
2016
2017
2018
2019
2020
2021
2022
2023
2024
2021, vol.26, no.1
2021, vol.26, no.2
2021, vol.26, no.3
2021, vol.26, no.4
2021, vol.26, no.5
2021, vol.26, no.6
题名
作者
出版年
年卷期
A Conditionally Chaotic Physically Unclonable Function Design Framework with High Reliability
SARANYU CHATTOPADHYAY; PRANESH SANTIKELLUR; RAJAT SUBHRA CHAKRABORTY; JIMSON MATHEW; MARCO OTTAVI
2021
2021, vol.26, no.6
Voltage-Based Covert Channels Using FPGAs
DENNIS R. E. GNAD; CONG DANG KHOA NGUYEN; SYED HASHIM GILLANI; MEHDI B. TAHOORI
2021
2021, vol.26, no.6
Placement of Digital Microfluidic Biochips via a New Evolutionary Algorithm
CHEN JIANG; BO YUAN; TSUNG-YI HO; XIN YAO
2021
2021, vol.26, no.6
FTT-NAS: Discovering Fault-tolerant Convolutional Neural Architecture
XUEFEI NING; GUANGJUN GE; WENSHUO LI; ZHENHUA ZHU; YIN ZHENG; XIAOMING CHEN; ZHEN GAO; YU WANG; HUAZHONG YANG
2021
2021, vol.26, no.6
A Variation-aware Hold Time Fixing Methodology for Single Flux Quantum Logic Circuits
XI LI; SOHEIL NAZAR SHAHSAVANI; XUAN ZHOU; MASSOUD PEDRAM; PETER A. BEEREL
2021
2021, vol.26, no.6
A Runtime Reconfigurable Design of Compute-in-Memory-Based Hardware Accelerator for Deep Learning Inference
ANNI LU; XIAOCHEN PENG; YANDONG LUO; SHANSHI HUANG; SHIMENG YU
2021
2021, vol.26, no.6
A Framework for Validation of Synthesized MicroElectrode Dot Array Actuations for Digital Microfluidic Biochips
PUSHPITA ROY; ANSUMAN BANERJEE
2021
2021, vol.26, no.6
High-throughput Near-Memory Processing on CNNs with 3D HBM-like Memory
NAEBEOM PARK; SUNGJU RYU; JAEHA KUNG; JAE-JOON KIM
2021
2021, vol.26, no.6
An Energy-Efficient Inference Method in Convolutional Neural Networks Based on Dynamic Adjustment of the Pruning Level
MOHAMMAD-ALI MALEKI; ALIREZA NABIPOUR-MEYBODI; MEHDI KAMAL; ALI AFZALI-KUSHA; MASSOUD PEDRAM
2021
2021, vol.26, no.6
A Delay-Adjustable, Self-Testable Flip-Flop for Soft-Error Tolerability and Delay-Fault Testability
DAVE Y.-W. LIN; CHARLES H.-P. WEN
2021
2021, vol.26, no.6
制造业外文文献服务平台