期刊


ISSN1537-0755
刊名Electronic Device Failure Analysis
参考译名电子设备故障分析
收藏年代2004～2025



全部

2004 2005 2006 2007 2008 2009
2010 2011 2012 2013 2014 2015
2016 2017 2018 2019 2020 2021
2022 2023 2024 2025

2021, vol.23, no.1 2021, vol.23, no.2 2021, vol.23, no.3

题名作者出版年年卷期
JOIN THE ONLINE COMMUNITY THROUGH CONNECTNicholas Antoniou20212021, vol.23, no.2
SECURITY ASSESSMENT OF IC PACKAGING AGAINST OPTICAL ATTACKSChengjie Xi; Aslam A. Khan; M. Tanjidur Rahman; Navid Asadizanjani20212021, vol.23, no.2
STATE-OF-THE-ART HIGH-RESOLUTION 3D X-RAY MICROSCOPY FOR IMAGING OF INTEGRATED CIRCUITSMirko Holler; Manuel Guizar-Sicairos; Jorg Raabe20212021, vol.23, no.2
TEM STUDY OF OXYGEN PARTIAL PRESSURE EFFECT ON EARLY LSM-YSZ SURFACE INTERACTIONS IN SOLID OXIDE FUEL CELLSH. J. Wang; M. Chen; Y. L. Liu; L. Theil Kuhn; J. R. Bowen20212021, vol.23, no.2
EDFAS USER GROUP SERIES 2021 HIGHLIGHTSTejinder Gandhi; Anita Madan; Ted Kolasa; EDFA User Group Co-Chairs20212021, vol.23, no.2
FOCUSED ION BEAM (FIB) VIRTUAL USER GROUPSteven Herschbein; Michael Wong; Valerie Brogden20212021, vol.23, no.2
SAMPLE PREP VIRTUAL USER GROUPJim Colvin; Bryan Tracy20212021, vol.23, no.2
CONTACTLESS PROBING AND NANOPROBING VIRTUAL USER GROUPDan Bockleman; Daminda Dahanayaka; Neel Leslie; Sara Ostrowski20212021, vol.23, no.2
SYSTEM ON PACKAGE VIRTUAL USER GROUPPrasad Divekar; Kevin Distelhurst20212021, vol.23, no.2
ARTIFACT-FREE CROSS SECTIONING OF HIGH ASPECT RATIO ETCH CAVITIES USING INKTravis Mitchell; Brian Popielarski; Frieder Baumann20212021, vol.23, no.2
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